Panasonic intellectual property management co., ltd. (20240118220). INSPECTION DEVICE AND INSPECTION METHOD simplified abstract
Contents
INSPECTION DEVICE AND INSPECTION METHOD
Organization Name
panasonic intellectual property management co., ltd.
Inventor(s)
Ryosuke Shigitani of Osaka (JP)
INSPECTION DEVICE AND INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240118220 titled 'INSPECTION DEVICE AND INSPECTION METHOD
Simplified Explanation
The inspection device described in the patent application includes a light source with a phosphor and a photodetector to detect reflected light from an inspection object. The spectral distribution of the inspection light has at least one maximum value derived from fluorescence emitted by the phosphor, with the maximum value falling within a wavelength range of 600 nm to 750 nm. Additionally, the spectral intensity at the maximum value is compared to the spectral intensity in longer wavelengths and shorter wavelengths to determine specific characteristics of the inspection object.
- Light source with phosphor
- Photodetector for detecting reflected light
- Spectral distribution with maximum value in specific wavelength range
- Comparison of spectral intensities at different wavelengths
- Potential Applications
- Quality control in manufacturing processes - Non-destructive testing in various industries - Medical imaging for diagnostics
- Problems Solved
- Accurate detection and analysis of reflected light - Enhanced inspection capabilities with specific wavelength ranges - Improved efficiency in identifying characteristics of inspection objects
- Benefits
- Precise and reliable inspection results - Increased sensitivity to fluorescence emissions - Versatile applications in different fields
- Potential Commercial Applications
- Fluorescence Inspection Device for Industrial Quality Control
- Potential Commercial Applications
- Possible Prior Art
There may be prior art related to fluorescence-based inspection devices used in various industries for quality control and testing purposes.
- Unanswered Questions
- How does the device handle variations in ambient light during inspections?
The patent application does not provide information on how the device compensates for changes in ambient light that may affect the accuracy of the inspection results.
- What is the expected lifespan of the phosphor in the light source?
The patent application does not mention the durability or longevity of the phosphor used in the light source and whether it may need replacement over time.
Original Abstract Submitted
provided is an inspection device including: a light source including a phosphor; and a photodetector, and detecting, using the photodetector, reflected light of the inspection light reflected by the inspection object. a spectral distribution of the inspection light has at least one maximum value derived from fluorescence emitted by the phosphor, and the maximum value is within a wavelength range of 600 nm or more and 750 nm or less. when pmax is set as a spectral intensity at the maximum value where the spectral intensity is largest at the at least one maximum value, a largest value of the spectral intensity in a wavelength range longer than 750 nm is 20% or more of pmax and less than pmax, and the spectral intensity within a wavelength range of 500 nm or more and 550 nm or less is less than 20% of pmax.
