Nvidia corporation (20240132083). ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS simplified abstract
Contents
- 1 ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
Organization Name
Inventor(s)
Anitha Kalva of San Jose CA (US)
Shantanu Sarangi of Saratoga CA (US)
Sailendra Chadalavada of Saratoga CA (US)
Milind Sonawane of Santa Clara CA (US)
Abilash Nerallapally of Newark CA (US)
ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240132083 titled 'ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
Simplified Explanation
The abstract of the patent application describes systems and methods for testing processing elements of an integrated processing system. The testing involves performing system tests on different processing elements using test nodes and local test controllers.
- Testing processing elements of an integrated processing system
- Performing system tests based on accessing test nodes associated with processing elements
- Using local test controllers to access and perform system tests on processing elements
Potential Applications
The technology described in this patent application could be applied in various industries where integrated processing systems are used, such as telecommunications, data centers, and manufacturing.
Problems Solved
1. Ensuring the reliability and functionality of processing elements in an integrated system. 2. Streamlining the testing process for different processing elements within the system.
Benefits
1. Improved efficiency in testing processing elements. 2. Enhanced system reliability and performance. 3. Simplified maintenance and troubleshooting of integrated processing systems.
Potential Commercial Applications
Optimizing Integrated Processing System Testing for Enhanced Performance
Possible Prior Art
Prior art in the field of integrated processing systems may include similar methods and systems for testing processing elements within a larger system.
Unanswered Questions
How does this technology compare to traditional testing methods for processing elements in integrated systems?
This technology streamlines the testing process by utilizing test nodes and local test controllers, but it would be beneficial to compare its efficiency and effectiveness against traditional testing methods.
What are the potential limitations or challenges in implementing this technology in different types of integrated processing systems?
It would be important to consider the scalability and compatibility of this technology with various integrated processing systems to understand any potential limitations or challenges in its implementation.
Original Abstract Submitted
systems and methods are disclosed that relate to testing processing elements of an integrated processing system. a first system test may be performed on a first processing element of an integrated processing system. the first system test may be based at least on accessing a test node associated with the first processing element. the first system test may be accessed using a first local test controller. a second system test may be performed on a second processing element of the integrated processing system. the second system test may be based at least on accessing a second test node associated with the second processing element. the second system test may be accessed using a second local test controller.
