Micron technology, inc. (20240125851). MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS simplified abstract

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MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS

Organization Name

micron technology, inc.

Inventor(s)

Kenneth M. Curewitz of Plymouth MA (US)

Jaime Cummins of Bainbridge Island WA (US)

John D. Porter of Boise ID (US)

Bryce D. Cook of Boise ID (US)

Jeffrey P. Wright of Boise ID (US)

MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240125851 titled 'MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS

Simplified Explanation

The abstract describes a memory controller and physical interface layer that can support multiple memory types and operating modes.

  • The memory controller and physical interface layer may have a register with operating parameters for different operating modes.
  • Different operating modes may be compatible with various memory types.
  • The system can be used for testing multiple memory types, providing multiple interfaces for communication with the memory.
  • The different communication types can be utilized for conducting various tests and simulating different devices that use the memory.

Potential Applications

This technology could be applied in various industries such as computer hardware manufacturing, semiconductor testing, and memory device development.

Problems Solved

This innovation addresses the challenge of efficiently testing and simulating multiple memory types using a single system, streamlining the development and validation process.

Benefits

The benefits of this technology include increased flexibility in testing different memory types, improved efficiency in system validation, and enhanced compatibility with a wide range of memory devices.

Potential Commercial Applications

Potential commercial applications of this technology include memory testing equipment, semiconductor testing systems, and memory device development tools.

Possible Prior Art

One possible prior art could be the use of memory controllers with fixed operating parameters for specific memory types, limiting the flexibility and compatibility of the system.

Unanswered Questions

How does this technology compare to existing memory testing systems in terms of speed and accuracy?

This article does not provide a direct comparison between this technology and existing memory testing systems in terms of speed and accuracy. Further research or testing may be needed to determine the performance metrics of this innovation.

What are the potential limitations or drawbacks of using this system for testing multiple memory types?

The article does not discuss any potential limitations or drawbacks of using this system for testing multiple memory types. It would be essential to investigate any challenges or constraints that may arise when implementing this technology in real-world applications.


Original Abstract Submitted

a memory controller and a physical interface layer may accommodate multiple memory types. in some examples, the memory controller and/or phy may include a register that includes operating parameters for multiple operating modes. different operating modes may be compatible with different memory types. in some examples, the memory controller and physical interface may be included in a system for testing multiple memory types. the system may provide multiple interfaces for communicating with the memory. the different communication types may be used for performing different tests and/or simulating different types of devices that may utilize the memory.