LASER MACHINING APPARATUS: abstract simplified (18020624)

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  • This abstract for appeared for patent application number 18020624 Titled 'LASER MACHINING APPARATUS'

Simplified Explanation

The abstract describes a laser machining apparatus that includes various components such as an actuator, a control unit, a machining state observation unit, a feature extraction unit, and a correction quantity calculation unit. The apparatus is used for laser machining processes and is capable of adjusting the relative positions of the machining head and the workpiece. The control unit controls the laser oscillator, machining head, and actuator based on a machining parameter. The machining state observation unit detects light intensities in different wavelength bands using optical sensor signals generated from the workpiece. The feature extraction unit extracts features from the correlation between the optical sensor signals and from individual sensor signals. The correction quantity calculation unit determines the correction parameter and the correction quantity for the machining parameter based on these features.


Original Abstract Submitted

A laser machining apparatus includes an actuator that changes relative positions of a machining head and a workpiece; a control unit that controls in machining execution the laser oscillator, the machining head, and the actuator based on a machining parameter; a machining state observation unit that detects, from process light that is light generated from the workpiece by laser beam irradiation, light intensities in a plurality of predetermined wavelength bands as a plurality of optical sensor signals; a feature extraction unit that extracts at least one of features, the features being obtainable from an index of correlation between the plurality of optical sensor signals and from one of the optical sensor signals; and a correction quantity calculation unit that determines the machining parameter to be corrected as a correction parameter and a correction quantity for the correction parameter based on the at least one of the features.