View source for Kabushiki kaisha toshiba (20240094092). MANUFACTURING DATA ANALYSIS DEVICE AND METHOD simplified abstract

=MANUFACTURING DATA ANALYSIS DEVICE AND METHOD=


==Organization Name==

[[:Category:kabushiki kaisha toshiba|kabushiki kaisha toshiba]]


[[Category:kabushiki kaisha toshiba]]

==Inventor(s)==

[[:Category:Wataru Watanabe of Tokyo (JP)|Wataru Watanabe of Tokyo (JP)]][[Category:Wataru Watanabe of Tokyo (JP)]]

[[:Category:Keisuke Kawauchi of Kawasaki Kanagawa (JP)|Keisuke Kawauchi of Kawasaki Kanagawa (JP)]][[Category:Keisuke Kawauchi of Kawasaki Kanagawa (JP)]]

[[:Category:Takayuki Itoh of Kawasaki Kanagawa (JP)|Takayuki Itoh of Kawasaki Kanagawa (JP)]][[Category:Takayuki Itoh of Kawasaki Kanagawa (JP)]]

[[:Category:Jumpei Ando of Yokohama Kanagawa (JP)|Jumpei Ando of Yokohama Kanagawa (JP)]][[Category:Jumpei Ando of Yokohama Kanagawa (JP)]]

[[:Category:Toshiyuki Ono of Kawasaki Kanagawa (JP)|Toshiyuki Ono of Kawasaki Kanagawa (JP)]][[Category:Toshiyuki Ono of Kawasaki Kanagawa (JP)]]

==MANUFACTURING DATA ANALYSIS DEVICE AND METHOD - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240094092 titled 'MANUFACTURING DATA ANALYSIS DEVICE AND METHOD

==Simplified Explanation==

The manufacturing data analysis device described in the abstract is designed to analyze manufacturing data related to multiple products in order to determine the relationship between manufacturing conditions and product quality.

* The device acquires manufacturing data, including manufacturing condition data and quality data, under different acquisition conditions to analyze the relationship between these variables.
* It calculates an analysis result based on the acquired data to understand how manufacturing conditions impact product quality.
* The device generates output data that includes the analysis result, providing valuable insights for improving manufacturing processes and product quality.

== Potential Applications ==
This technology can be applied in various industries such as manufacturing, automotive, electronics, and pharmaceuticals to optimize production processes and enhance product quality.

== Problems Solved ==
This technology helps in identifying the factors that influence product quality, allowing manufacturers to make informed decisions to improve their processes and reduce defects.

== Benefits ==
- Improved product quality
- Enhanced manufacturing efficiency
- Cost savings through reduced defects and waste

== Potential Commercial Applications ==
"Optimizing Manufacturing Processes for Enhanced Product Quality"

== Possible Prior Art ==
One possible prior art could be a similar device or system used in the manufacturing industry to analyze and optimize production processes based on data related to manufacturing conditions and product quality.

=== Unanswered Questions ===

=== How does this technology handle large volumes of manufacturing data? ===
The abstract does not provide details on how the device manages and processes a large amount of manufacturing data to generate accurate analysis results.

=== Can this technology be integrated with existing manufacturing systems? ===
It is unclear from the abstract whether this device can be easily integrated with current manufacturing systems to provide real-time insights and improvements.


==Original Abstract Submitted==

according to one embodiment, a manufacturing data analysis device includes processing circuitry. the processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. the first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. the processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. the processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. the processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data. the processing circuitry generates output data including the analysis result.



[[Category:G01M99/00]]