View source for Intel corporation (20240126681). Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry simplified abstract

=Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry=


==Organization Name==

[[:Category:intel corporation|intel corporation]]


[[Category:intel corporation]]

==Inventor(s)==

[[:Category:Zhiguo Wei of Shanghai (CN)|Zhiguo Wei of Shanghai (CN)]][[Category:Zhiguo Wei of Shanghai (CN)]]

[[:Category:Yufu Li of Shanghai (CN)|Yufu Li of Shanghai (CN)]][[Category:Yufu Li of Shanghai (CN)]]

[[:Category:Tao Xu of Shanghai (CN)|Tao Xu of Shanghai (CN)]][[Category:Tao Xu of Shanghai (CN)]]

==Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240126681 titled 'Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry

==Simplified Explanation==

The patent application describes a method and apparatus for detecting data lane mapping between two circuitries in a system. The process involves transferring a specific data pattern from an external device to the first circuitry via the second data lanes, while adjusting timing parameters iteratively to determine the mapping for a target second data lane.

* The method involves performing a data transfer test between the external device and the first circuitry.
* The test is done by adjusting timing parameters for the second data lanes in a pre-configured range.
* The timing parameter for the target second data lane is set to an invalid value during the test.
* Data lane mapping for the target second data lane is determined based on the test results.

== Potential Applications ==
This technology can be applied in various industries such as telecommunications, data centers, and automotive systems where data transfer and mapping between circuitries are crucial.

== Problems Solved ==
This innovation solves the problem of efficiently detecting and determining data lane mapping between different circuitries in a system, ensuring accurate data transfer and communication.

== Benefits ==
The benefits of this technology include improved data transfer efficiency, reduced errors in data mapping, and enhanced overall system performance.

== Potential Commercial Applications ==
Potential commercial applications of this technology include high-speed data transfer systems, network infrastructure equipment, and communication devices.

== Possible Prior Art ==
One possible prior art for this technology could be methods for testing data transfer and mapping between circuitries in a system, but the specific approach described in this patent application may be novel and inventive.

=== Unanswered Questions ===

== How does this technology compare to existing methods for data lane mapping detection in terms of accuracy and efficiency? ==
The article does not provide a direct comparison with existing methods for data lane mapping detection. Further research or testing may be needed to evaluate the accuracy and efficiency of this technology compared to other methods.

== What are the potential limitations or challenges in implementing this technology in real-world systems? ==
The article does not address potential limitations or challenges in implementing this technology. Factors such as compatibility with different systems, scalability, and cost-effectiveness could be important considerations for practical applications.


==Original Abstract Submitted==

a method and apparatus for detecting data lane mapping between a first circuitry and a second circuitry in a system. the first and second circuitry include a plurality of first and second data lanes, respectively that are mapped each other. the external device and the first circuitry are configured with a specific data pattern. a data transfer test is performed such that the specific data pattern is transferred from the external device to the first circuitry via the second data lanes. the data transfer test is performed iteratively by adjusting timing parameters for the second data lanes in the second circuitry in a pre-configured range while setting a timing parameter for a target second data lane in the second circuitry to an invalid value. data lane mapping for the target second data lane between the first circuitry and the second circuitry is determined based on the data transfer test result.



[[Category:G06F12/02]]