TESTING A SEMICONDUCTOR DEVICE USING X-RAYS

Embodiments described in this patent application relate to using x-rays to alter or observe circuits within a semiconductor device before, during, or after testing.

X-rays are utilized to manipulate or inspect circuits in semiconductor devices.
The process can occur before, during, or after testing the semiconductor device.

Potential Applications

This technology could be applied in the following areas:

Semiconductor manufacturing
Quality control in semiconductor production
Research and development in the semiconductor industry

Problems Solved

This technology helps address the following issues:

Ensuring the integrity of circuits in semiconductor devices
Improving testing accuracy and efficiency
Enhancing the overall performance of semiconductor devices

Benefits

The use of x-rays in this manner offers several advantages, including:

Non-destructive testing of circuits
Precise observation and manipulation of circuitry
Increased reliability and functionality of semiconductor devices

Potential Commercial Applications

This technology has potential commercial applications in:

Semiconductor testing equipment
Semiconductor fabrication facilities
Research institutions focusing on semiconductor technology

Possible Prior Art

One possible prior art in this field is the use of electron microscopy to observe circuits in semiconductor devices. However, x-ray technology offers distinct advantages in terms of non-destructive testing and manipulation capabilities.

Unanswered Questions

How does this technology compare to traditional methods of circuit inspection in semiconductor devices?

This article does not provide a direct comparison between x-ray technology and other conventional methods of circuit inspection in semiconductor devices.

What are the limitations of using x-rays for altering or observing circuits in semiconductor devices?

The article does not address any potential limitations or challenges associated with the use of x-rays for altering or observing circuits in semiconductor devices.

Original Abstract Submitted

embodiments described herein may be related to apparatuses, processes, systems, and/or techniques for using x-rays to alter or observe circuits within a semiconductor device before, during or after a test of the semiconductor device. other embodiments may be described and/or claimed.

Intel corporation (20240103072). TESTING A SEMICONDUCTOR DEVICE USING X-RAYS simplified abstract

Contents

TESTING A SEMICONDUCTOR DEVICE USING X-RAYS

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