Dell products l.p. (20240126634). METHOD, DEVICE, AND COMPUTER PROGRAM PRODUCT FOR FAULT DIAGNOSIS simplified abstract

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METHOD, DEVICE, AND COMPUTER PROGRAM PRODUCT FOR FAULT DIAGNOSIS

Organization Name

dell products l.p.

Inventor(s)

Jiacheng Ni of Shanghai (CN)

Jinpeng Liu of Shanghai (CN)

Zijia Wang of WeiFang (CN)

Zhen Jia of Shanghai (CN)

METHOD, DEVICE, AND COMPUTER PROGRAM PRODUCT FOR FAULT DIAGNOSIS - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240126634 titled 'METHOD, DEVICE, AND COMPUTER PROGRAM PRODUCT FOR FAULT DIAGNOSIS

Simplified Explanation

The abstract of the patent application describes a method for fault diagnosis in a storage system, where environmental factors are considered in determining the cause of a fault and whether it can be solved locally. If the fault cannot be solved locally, it is sent to a second diagnosis model for further analysis.

  • Determining cause of fault based on environmental factors
  • Analyzing if fault can be solved locally
  • Sending fault to second diagnosis model if not solvable locally
  • Reducing workload of customer support team in cloud storage system

Potential Applications

The technology can be applied in various storage systems, cloud computing environments, and data centers where fault diagnosis and resolution are crucial for maintaining system efficiency.

Problems Solved

1. Efficient fault diagnosis in storage systems 2. Reduction of workload for customer support teams

Benefits

1. Improved system reliability 2. Faster fault resolution 3. Cost savings for storage system operators

Potential Commercial Applications

"Fault Diagnosis Method for Storage Systems" can be utilized by cloud service providers, data centers, and storage system manufacturers to enhance the performance and reliability of their systems.

Possible Prior Art

One possible prior art could be fault diagnosis methods in computer networks or server systems, which may not specifically address the consideration of environmental factors in fault diagnosis like the present disclosure.

What are the limitations of the fault diagnosis method described in the patent application?

The patent application does not mention the scalability of the method for large-scale storage systems or the potential impact on system performance during fault diagnosis.

How does the fault diagnosis method compare to existing fault diagnosis techniques in terms of accuracy and efficiency?

The patent application does not provide a direct comparison with existing fault diagnosis techniques, so it is unclear how the method performs in terms of accuracy and efficiency compared to other methods.


Original Abstract Submitted

a method in an illustrative embodiment of the present disclosure includes determining, utilizing a first diagnosis model deployed in a storage system, whether a cause of a fault belongs to environmental factors. the method further includes determining, responsive to determining that the cause of the fault belongs to the environmental factors, whether the fault can be solved locally in the storage system. the method further includes sending, responsive to determining that the fault cannot be solved locally in the storage system, the fault to a second diagnosis model, wherein the first diagnosis model is obtained by distilling the second diagnosis model. according to the method for fault diagnosis of the present disclosure, particular faults can be diagnosed and solved locally in a storage system, so that the workload of a customer support team of the storage system in a cloud can be reduced.