Apple inc. (20240102856). Despeckling in Optical Measurement Systems simplified abstract

Despeckling in Optical Measurement Systems

Organization Name

apple inc.

Inventor(s)

Matthew A. Terrel of Campbell CA (US)

David S. Gere of Palo Alto CA (US)

Alexander F. Sugarbaker of Woodside CA (US)

Thomas C. Greening of San Jose CA (US)

Jason S. Pelc of Sunnyvale CA (US)

Mark A. Arbore of Los Altos CA (US)

Despeckling in Optical Measurement Systems - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240102856 titled 'Despeckling in Optical Measurement Systems

Simplified Explanation

The abstract describes an optical measurement system that utilizes multiple emitters to emit light during a measurement. The system includes a light generation assembly with a light source unit and a photonic integrated circuit with a launch group containing multiple emitters. Each emitter is optically coupled to the light generation assembly and emits light received from it.

• The optical measurement system uses multiple emitters to emit light during a measurement.
• The system includes a light generation assembly with a light source unit and a photonic integrated circuit with multiple emitters.
• Each emitter is optically coupled to the light generation assembly and emits light received from it simultaneously during a measurement.

Potential Applications

This technology could be applied in various fields such as:

• Biomedical imaging
• Environmental monitoring
• Industrial process control

Problems Solved

This technology helps in:

• Improving measurement accuracy
• Enhancing data collection efficiency
• Increasing the speed of measurements

Benefits

The benefits of this technology include:

• Enhanced performance in optical measurements
• Increased reliability in data collection
• Improved overall system efficiency

Potential Commercial Applications

Potential commercial applications of this technology could include:

• Medical devices
• Environmental monitoring systems
• Industrial automation equipment

Possible Prior Art

One possible prior art could be the use of single emitters in optical measurement systems instead of multiple emitters. However, the use of multiple emitters simultaneously emitting light during a measurement could be a novel aspect of this technology.

How does this technology compare to existing optical measurement systems in terms of accuracy and efficiency?

This article does not provide a direct comparison with existing optical measurement systems in terms of accuracy and efficiency. Further research or testing may be needed to determine the specific advantages of this technology over existing systems.

What are the potential limitations or challenges in implementing this technology in practical applications?

The article does not address potential limitations or challenges in implementing this technology in practical applications. Factors such as cost, scalability, and compatibility with existing systems could be important considerations that need to be explored further.

Original Abstract Submitted

embodiments are directed to optical measurement systems that utilize multiple emitters to emit light during a measurement, as well as methods of performing measurements using these optical measurement systems. the optical measurement systems may include a light generation assembly that is configured to generate light via a light source unit, and a photonic integrated circuit that includes a launch group having a plurality of emitters. each of these emitters is optically coupled to the light generation assembly to receive light generated from the light generation assembly, and may emit this light from a surface of the photonic integrated circuit. the optical measurement system may perform a measurement in which the light generation assembly generates light and each of the plurality of emitters simultaneously emit light received from the light generation assembly.