20240044940. CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES simplified abstract (TECHNOPROBE S.P.A.)

From WikiPatents
Jump to navigation Jump to search

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

Organization Name

TECHNOPROBE S.P.A.

Inventor(s)

Roberto Crippa of Cernusco Lombardone (LC) (IT)

Flavio Maggioni of Cernusco Lombardone (LC) (IT)

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240044940 titled 'CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

Simplified Explanation

The abstract describes a contact probe that is used in testing devices. It has a first contact end portion that connects to a device under test and a second contact end portion that connects to a testing apparatus. The probe body is rod-shaped and extends between the two contact end portions. The probe also includes an opening that runs along the probe body and at least one contact end portion. The opening is divided into a first opening part that forms a pair of arms in the probe body and a second opening part that forms a pair of end sections in the contact end portion.

  • The contact probe is designed to make electrical connections between a device under test and a testing apparatus.
  • It has a unique structure with a rod-shaped probe body and two contact end portions.
  • The opening along the probe body and contact end portion allows for flexibility and movement during testing.
  • The first opening part forms a pair of arms, providing additional flexibility and adaptability.
  • The second opening part forms a pair of end sections, allowing for secure and reliable contact with the contact pads.

Potential applications of this technology:

  • Testing and quality control of electronic devices.
  • Circuit board testing and troubleshooting.
  • Semiconductor manufacturing and testing.

Problems solved by this technology:

  • Ensures accurate and reliable electrical connections during testing.
  • Provides flexibility and adaptability to accommodate different device under test and testing apparatus configurations.
  • Improves the efficiency and effectiveness of testing processes.

Benefits of this technology:

  • Reduces testing time and costs by improving the accuracy and reliability of electrical connections.
  • Enhances the overall quality and performance of tested devices.
  • Increases the productivity and efficiency of testing operations.


Original Abstract Submitted

a contact probe is disclosed having a first contact end portion adapted to abut onto a contact pad of a device under test, a second contact end portion adapted to abut onto a contact pad of a pcb board of a testing apparatus, and a rod-shaped probe body extended between the first and second contact end portions according to a longitudinal direction. the contact probe also includes an opening that extends along the probe body and along at least one contact end portion, a first opening part defining a pair of arms in the probe body and a second opening part defining a pair of end sections in the contact end portion.

Retrieved from "http://wikipatents.org/index.php?title=20240044940._CONTACT_PROBE_FOR_PROBE_HEADS_OF_ELECTRONIC_DEVICES_simplified_abstract_(TECHNOPROBE_S.P.A.)&oldid=32639"