View source for 18543170. DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE simplified abstract (Micron Technology, Inc.)

=DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Steven Michael Kientz of Westminster CO (US)|Steven Michael Kientz of Westminster CO (US)]][[Category:Steven Michael Kientz of Westminster CO (US)]]

==DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18543170 titled 'DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE

==Simplified Explanation==

The patent application describes a method for identifying a target block family in a memory device and assigning each die to a respective die family based on die measurements obtained from voltage shifts of blocks within the target block family.

* Identification of target block family periodically every predetermined number of program erase cycles (PECs) of a memory device.
* Obtaining temporal voltage shifts of blocks within the target block family from each die of a plurality of dies associated with the target block family.
* Calculating die measurements based on the average of the voltage shifts of blocks from each die.
* Assigning each die to a respective die family within a plurality of consecutive die families based on the die measurements.

== Potential Applications ==
This technology could be applied in the development of more efficient memory devices, particularly in managing and organizing data within block families.

== Problems Solved ==
This technology solves the problem of efficiently assigning dies to die families based on performance metrics, optimizing the overall functionality of memory devices.

== Benefits ==
- Improved organization and management of data within memory devices.
- Enhanced performance and efficiency in memory operations.
- Streamlined processes for assigning dies to die families.

== Potential Commercial Applications ==
"Optimizing Die Assignment in Memory Devices for Improved Performance and Efficiency"

== Possible Prior Art ==
There may be prior art related to memory device management and organization techniques, but specific examples are not provided in the abstract.

=== Unanswered Questions ===

=== How does this technology impact the overall lifespan of memory devices? ===
This article does not address the potential effects of die assignment on the longevity of memory devices.

=== Are there any security implications associated with this method of die assignment? ===
The abstract does not mention any security considerations related to the die assignment process.


==Original Abstract Submitted==

A target block family of a plurality of block families is identified periodically every predetermined number of program erase cycles (PECs) of a memory device. Each block family includes a plurality of blocks. A respective temporal voltage shift of each block of a subset of blocks of the target block family from each die of a plurality of dies associated with the target block family is obtained. A respective die measurement for each respective die is obtained based on an average of the respective temporal voltage shifts of the subset of blocks from each die. Each respective die to a respective die family of a plurality of consecutive die families is assigned based on the respective die measurement for each respective die.



[[Category:G06F3/06]]