18539350. Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry simplified abstract (Intel Corporation)
Contents
- 1 Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry
Organization Name
Inventor(s)
Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry - A simplified explanation of the abstract
This abstract first appeared for US patent application 18539350 titled 'Method and system for dynamically detecting memory sub-channel mapping and data lane mapping between a memory controller and physical layer circuitry
Simplified Explanation
The patent application describes a method and apparatus for detecting data lane mapping between two circuitries in a system by performing a data transfer test with a specific data pattern.
- The first and second circuitries have multiple data lanes that are mapped to each other.
- A data transfer test is conducted by transferring a specific data pattern from an external device to the first circuitry via the second data lanes.
- The test is performed iteratively by adjusting timing parameters for the second data lanes while setting a timing parameter for a target second data lane to an invalid value.
- Data lane mapping for the target second data lane is determined based on the test results.
Potential Applications
This technology can be applied in:
- System integration testing
- Hardware debugging
- Data transfer optimization
Problems Solved
This technology solves the following problems:
- Ensuring accurate data lane mapping between circuitries
- Identifying and resolving data transfer issues
- Improving system performance and reliability
Benefits
The benefits of this technology include:
- Streamlining system integration processes
- Enhancing hardware testing efficiency
- Facilitating data transfer optimization
Potential Commercial Applications
A potential commercial application for this technology could be in:
- Semiconductor manufacturing industry
- Electronics testing equipment market
- Data center hardware optimization services
Possible Prior Art
One possible prior art for this technology could be:
- Existing methods for data lane mapping detection in system integration testing.
Unanswered Questions
How does this technology compare to existing data lane mapping detection methods?
This article does not provide a direct comparison with existing methods for data lane mapping detection. It would be helpful to understand the specific advantages and limitations of this technology compared to traditional approaches.
What are the specific timing parameters that need to be adjusted during the data transfer test?
The article mentions adjusting timing parameters for the second data lanes, but it does not specify the exact parameters or their significance in the testing process. Understanding the specific timing adjustments required would provide more insight into the implementation of this technology.
Original Abstract Submitted
A method and apparatus for detecting data lane mapping between a first circuitry and a second circuitry in a system. The first and second circuitry include a plurality of first and second data lanes, respectively that are mapped each other. The external device and the first circuitry are configured with a specific data pattern. A data transfer test is performed such that the specific data pattern is transferred from the external device to the first circuitry via the second data lanes. The data transfer test is performed iteratively by adjusting timing parameters for the second data lanes in the second circuitry in a pre-configured range while setting a timing parameter for a target second data lane in the second circuitry to an invalid value. Data lane mapping for the target second data lane between the first circuitry and the second circuitry is determined based on the data transfer test result.
