View source for 18522644. OVERSHOOT CURRENT DETECTION AND CORRECTION CIRCUIT FOR ELECTRICAL FAST TRANSIENT EVENTS simplified abstract (TEXAS INSTRUMENTS INCORPORATED)

=OVERSHOOT CURRENT DETECTION AND CORRECTION CIRCUIT FOR ELECTRICAL FAST TRANSIENT EVENTS=


==Organization Name==

[[:Category:TEXAS INSTRUMENTS INCORPORATED|TEXAS INSTRUMENTS INCORPORATED]]


[[Category:TEXAS INSTRUMENTS INCORPORATED]]

==Inventor(s)==

[[:Category:Shishir Goyal of Bengaluru (IN)|Shishir Goyal of Bengaluru (IN)]][[Category:Shishir Goyal of Bengaluru (IN)]]

[[:Category:Lokesh Kumar Gupta of Benagluru (IN)|Lokesh Kumar Gupta of Benagluru (IN)]][[Category:Lokesh Kumar Gupta of Benagluru (IN)]]

==OVERSHOOT CURRENT DETECTION AND CORRECTION CIRCUIT FOR ELECTRICAL FAST TRANSIENT EVENTS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18522644 titled 'OVERSHOOT CURRENT DETECTION AND CORRECTION CIRCUIT FOR ELECTRICAL FAST TRANSIENT EVENTS

==Simplified Explanation==

The positive overshoot detection circuit described in the patent application includes a transistor coupled to a current mirror, a reference current source connected to the current mirror, and a comparator that compares the current mirror's current to the reference current source's current. The output of the comparator indicates whether there is an overshoot in the current. Additionally, a clamping circuit is used to control the transistor's current terminal.

* Transistor coupled to a current mirror
* Reference current source connected to the current mirror
* Comparator compares current mirror's current to reference current source's current
* Clamping circuit controls transistor's current terminal

The negative overshoot detection circuit in the patent application consists of a biasing sub-circuit connected to a transistor, a resistor connected to the transistor, and a comparator that determines whether the transistor is in an on or off state. The biasing sub-circuit is linked to a clamping circuit to regulate its operation.

* Biasing sub-circuit connected to a transistor
* Resistor connected to the transistor
* Comparator determines transistor's state
* Biasing sub-circuit linked to a clamping circuit

### Potential Applications
- Electronic circuit protection systems
- Overcurrent detection in power supply units

### Problems Solved
- Preventing current overshoot in electronic circuits
- Ensuring stable operation of electronic devices

### Benefits
- Improved reliability of electronic systems
- Enhanced protection against overcurrent situations

### Potential Commercial Applications
#### Electronic Circuit Protection Systems: Safeguarding sensitive electronic components from current overshoots
#### Overcurrent Detection in Power Supply Units: Ensuring stable and safe operation of power supplies

### Possible Prior Art
There are existing overshoot detection circuits in the field of electronics, but the specific combination of components and features described in this patent application may be novel and innovative.

#### Unanswered Questions
#### How does the circuit respond to rapid changes in current levels?
The patent application does not provide detailed information on the circuit's response time to sudden changes in current levels.

#### What is the power consumption of the circuit?
The power consumption of the circuit is not explicitly mentioned in the patent application, leaving uncertainty about its efficiency in terms of energy usage.


==Original Abstract Submitted==

A positive overshoot detection circuit comprises a transistor coupled to a current mirror, a reference current source coupled to the current mirror, and a comparator coupled to the reference current source and the current mirror. The comparator output indicates whether the current mirror's current is greater than the reference current source's current. A control input and a current terminal of the transistor are coupled to a clamping circuit. A negative overshoot detection circuit comprises a biasing sub-circuit coupled to a transistor, a resistor coupled to the transistor, and a comparator coupled to the transistor and the resistor. The comparator output indicates whether the transistor is in an on or off state. The biasing sub-circuit is coupled to a clamping circuit. In some implementations, the comparator outputs from the positive and negative overshoot detection circuits are provided to a driver circuit, which modifies its operation.



[[Category:H02H9/04]]
[[Category:G01R19/10]]
[[Category:G01R19/165]]
[[Category:H02H1/00]]
[[Category:H03K17/082]]