18521585. Enclosure Detection for Reliable Optical Failsafe simplified abstract (Apple Inc.)

Enclosure Detection for Reliable Optical Failsafe

Organization Name

Apple Inc.

Inventor(s)

Michael K. Mccord of San Francisco CA (US)

Stacy H. Mo of San Francisco CA (US)

Enclosure Detection for Reliable Optical Failsafe - A simplified explanation of the abstract

This abstract first appeared for US patent application 18521585 titled 'Enclosure Detection for Reliable Optical Failsafe

Simplified Explanation

The optical component integrity monitoring circuitry described in the patent application monitors the integrity of an optical component by detecting a rise in resistance in the sensing path and preventing the emission of light if damage is detected.

• The circuitry includes a sensing path with a first path for detecting damage to the optical element and a second path coupled to a package covering the optical element and light-emitting device.
• The first path is made up of a metal trace on the optical element and a wire bond, providing mechanical compliance to tolerate expected strains.
• The second path ensures that the package is present to constrain movement of the optical element and its wires within a safe envelope defined by the package interior.

Potential Applications

The technology described in the patent application could be applied in various industries such as telecommunications, automotive, aerospace, and medical devices where optical components are used.

Problems Solved

This technology helps in detecting damage to optical components early on, preventing potential failures and ensuring the reliability and longevity of the optical devices.

Benefits

The benefits of this technology include increased safety, improved performance, reduced maintenance costs, and enhanced overall system reliability.

Potential Commercial Applications

• "Optical Component Integrity Monitoring Circuitry for Enhanced Safety and Reliability in Telecommunications"
• "Advanced Optical Component Monitoring System for Aerospace Applications"

Possible Prior Art

There may be prior art related to optical component monitoring systems used in different industries, but specific examples are not provided in the patent application.

How does the circuitry differentiate between normal resistance fluctuations and actual damage to the optical component?

The patent application does not provide detailed information on how the circuitry distinguishes between normal resistance changes and damage to the optical component.

What is the expected lifespan of the optical component integrity monitoring circuitry?

The patent application does not mention the expected lifespan or durability of the monitoring circuitry.

Original Abstract Submitted

Optical component integrity monitoring circuitry monitors an optical component integrity sensing path in an optical component. If a rise in resistance of the sensing path is detected, the circuitry prevents the optical component from emitting light. The optical component may have a light-emitting device that emits light through an optical element. The sensing path may have a first path that is used to detect damage to the optical element and a second path that is coupled to a package covering the optical element and light-emitting device. The first path may have a segment formed from a metal trace on the optical element and a segment formed from a wire bond, providing mechanical compliance to tolerate strains expected in the use case. The second path ensures that the package is present to constrain movement of the optical element and its wires within a safe envelope defined by the package interior.