18519651. DIAGNOSTIC ROBOT AND DIAGNOSTIC METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)

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DIAGNOSTIC ROBOT AND DIAGNOSTIC METHOD THEREOF

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Sangyoung Hwang of Suwon-si (KR)

Woomok Kim of Suwon-si (KR)

Jooyoung Kim of Suwon-si (KR)

Boseok Moon of Suwon-si (KR)

Dongshin Song of Suwon-si (KR)

Hyunmi Choi of Suwon-si (KR)

DIAGNOSTIC ROBOT AND DIAGNOSTIC METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 18519651 titled 'DIAGNOSTIC ROBOT AND DIAGNOSTIC METHOD THEREOF

Simplified Explanation

The diagnostic robot described in the patent application is designed to search for electronic devices, select a target device, identify a component for fault diagnosis, transmit diagnostic information, obtain diagnostic data, and analyze for abnormalities.

  • Communication interface for searching and selecting electronic devices
  • Identification of components for fault diagnosis
  • Transmission of diagnostic information to target device
  • Obtaining diagnostic data from target device
  • Analysis of diagnostic data for abnormalities

Potential Applications

The technology could be applied in various industries such as electronics manufacturing, automotive, aerospace, and telecommunications for efficient fault diagnosis of electronic components.

Problems Solved

This technology solves the problem of manual fault diagnosis of electronic devices, which can be time-consuming and prone to errors. The diagnostic robot automates the process, leading to faster and more accurate results.

Benefits

The benefits of this technology include increased efficiency in fault diagnosis, reduced downtime of electronic devices, improved accuracy in identifying abnormalities, and overall cost savings for businesses.

Potential Commercial Applications

The technology can be commercialized as a diagnostic service for electronic device manufacturers, maintenance and repair companies, and quality control departments in various industries.

Possible Prior Art

One possible prior art could be automated testing equipment used in electronics manufacturing for quality control and fault diagnosis processes.

Unanswered Questions

How does the diagnostic robot handle complex electronic devices with multiple components for fault diagnosis?

The patent application does not provide details on the specific methodology or algorithms used by the diagnostic robot to handle complex electronic devices with multiple components. Further information on the diagnostic process for such devices would be beneficial for understanding the technology's capabilities.

What measures are in place to ensure the security and privacy of the diagnostic data transmitted and received by the diagnostic robot?

The patent application does not address the security and privacy concerns related to the transmission and storage of diagnostic data. It would be important to know what encryption methods or protocols are used to protect sensitive information and prevent unauthorized access to the data.


Original Abstract Submitted

Provided is a diagnostic robot including: a communication interface; and at least one processor configured to: control the communication interface to search for at least one candidate electronic device, select a target electronic device from among the at least one candidate electronic device, and identify a component of the target electronic device on which to perform a fault diagnosis, control the communication interface to transmit information associated with a diagnosis range to the target electronic device, obtain first diagnostic data by performing a first fault diagnosis on a component of the diagnostic robot, control the communication interface to receive, from the target electronic device, second diagnostic data generated from a second fault diagnosis performed on the component of the target electronic device while the target electronic device is positioned at a diagnosis area within the diagnosis range, and identify whether there is an abnormality in the component of the target electronic device based on the first diagnostic data and the second diagnostic data.