18518629. CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.)
Contents
- 1 CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
Organization Name
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
Inventor(s)
TSUNG-YANG Hung of HSINCHU COUNTY (TW)
MING-YIH Wang of HSIN-CHU (TW)
CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18518629 titled 'CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
Simplified Explanation
The circuit screening system described in the abstract involves a target circuit under test that receives testing signals in different periods triggered by a clock signal with specific profiles and phase differences.
- The target circuit under test receives a first testing signal in a first period and a second testing signal in a second period.
- A clock generating circuit provides a clock signal to the target circuit, triggering it to receive the testing signals.
- The clock signal has a first profile and a second profile in the first and second periods, respectively, with a phase difference between them.
Potential Applications
This technology can be applied in:
- Integrated circuit testing
- Quality control in electronics manufacturing
Problems Solved
This technology helps in:
- Efficiently screening circuits for defects
- Ensuring proper functioning of electronic components
Benefits
The benefits of this technology include:
- Improved reliability of electronic devices
- Cost-effective testing methods
Potential Commercial Applications
This technology can be used in:
- Semiconductor industry for testing integrated circuits
- Electronics manufacturing for quality assurance
Possible Prior Art
One possible prior art for this technology could be:
- Existing circuit screening systems using clock signals to trigger testing signals.
Unanswered Questions
How does this technology compare to traditional circuit testing methods?
This article does not provide a direct comparison between this technology and traditional circuit testing methods.
What are the specific parameters of the clock signal profiles mentioned in the abstract?
The abstract does not specify the exact parameters of the clock signal profiles used in the circuit screening system.
Original Abstract Submitted
A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.
