18516499. SYSTEM AND METHOD OF VERIFYING SLANTED LAYOUT COMPONENTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)

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SYSTEM AND METHOD OF VERIFYING SLANTED LAYOUT COMPONENTS

Organization Name

Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor(s)

Yuan-Te Hou of Hsinchu City (TW)

Min-Yuan Tsai of Hsinchu County (TW)

SYSTEM AND METHOD OF VERIFYING SLANTED LAYOUT COMPONENTS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18516499 titled 'SYSTEM AND METHOD OF VERIFYING SLANTED LAYOUT COMPONENTS

Simplified Explanation

The patent application relates to verifying the layout design of an integrated circuit with slanted layout components.

  • Detection of slanted layout components with a side slanted from a base axis by an offset angle.
  • Transformation of the location of a vertex of the slanted layout component to obtain the location of a rotated vertex of a rotated layout component.
  • Performing layout verification on the rotated layout component with respect to the base axis.

Potential Applications

  • Semiconductor industry for integrated circuit design and manufacturing.
  • Electronic design automation tools for layout verification processes.

Problems Solved

  • Ensuring accurate layout verification of integrated circuits with slanted components.
  • Improving the efficiency of detecting and handling slanted layout components in integrated circuit designs.

Benefits

  • Enhanced accuracy in layout verification processes.
  • Increased reliability of integrated circuit designs.
  • Improved overall performance of electronic devices utilizing the integrated circuits.


Original Abstract Submitted

Disclosed herein are related to performing layout verification of a layout design of an integrated circuit having a slanted layout component. In one aspect, a slanted layout component having a side slanted from a base axis by an offset angle is detected. In one aspect, a first location of a vertex of the slanted layout component according to the offset angle is transformed to obtain a second location of a rotated vertex of a rotated layout component. In one aspect, layout verification is performed on the rotated layout component with respect to the base axis.

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