18483954. OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD simplified abstract (NEC Corporation)

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OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD

Organization Name

NEC Corporation

Inventor(s)

Katsuhiro Yutani of Tokyo (JP)

OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18483954 titled 'OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD

Simplified Explanation

The optical sensing device described in the patent application utilizes point cloud data acquisition and laser light technology to detect abnormalities in objects within a specified region. Here is a simplified explanation of the patent:

  • First point cloud data acquisition unit acquires data of objects in a region.
  • Region specification unit specifies a second region associated with a first object.
  • Second point cloud data acquisition unit emits laser light to detect abnormalities in the first object.
  • First abnormality detection unit analyzes the second point cloud data to detect abnormalities.

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      1. Potential Applications of this Technology

1. Industrial quality control for detecting defects in manufactured objects. 2. Medical imaging for identifying abnormalities in biological tissues.

      1. Problems Solved by this Technology

1. Efficient and accurate detection of abnormalities in objects. 2. Non-invasive inspection of objects for defects or irregularities.

      1. Benefits of this Technology

1. Improved accuracy in identifying abnormalities. 2. Increased efficiency in quality control processes.

      1. Potential Commercial Applications of this Technology
        1. Enhanced Object Inspection for Quality Control

Utilizing advanced optical sensing technology for precise detection of defects in manufactured products.

      1. Possible Prior Art

There may be prior art related to optical sensing devices using point cloud data acquisition and laser technology for object inspection and defect detection. However, specific examples are not provided in this context.

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      1. Unanswered Questions
        1. How does the device handle complex shapes and surfaces when detecting abnormalities?

The patent abstract does not specify how the device deals with intricate object structures during the abnormality detection process.

        1. What is the range and accuracy of the device in detecting abnormalities?

The abstract does not mention the limitations of the device in terms of distance and precision when identifying abnormalities in objects.


Original Abstract Submitted

An optical sensing device includes a first point cloud data acquisition unit for acquiring first point cloud data associated with a first object and a second object that are included in a first region, a region specification unit for specifying a second region associated with the first object in the first region, a second point cloud data acquisition unit for acquiring second point cloud data associated with the first object by emitting second laser light from the light source to a plurality of second positions associated with the second region, based on second laser reflection light being reflection light of the second laser light, and a first abnormality detection unit for detecting abnormality of the first object, by using the second point cloud data.

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