18483413. SEMICONDUCTOR DEVICES INCLUDING GATE SPACER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
SEMICONDUCTOR DEVICES INCLUDING GATE SPACER
Organization Name
Inventor(s)
Daewon Kim of Hwaseong-si (KR)
Beomjin Park of Hwaseong-si (KR)
Bongseob Yang of Suwon-si (KR)
Jaeyun Lee of Hwaseong-si (KR)
SEMICONDUCTOR DEVICES INCLUDING GATE SPACER - A simplified explanation of the abstract
This abstract first appeared for US patent application 18483413 titled 'SEMICONDUCTOR DEVICES INCLUDING GATE SPACER
Simplified Explanation
The abstract describes a semiconductor device with specific components and features. It includes a first active region on a substrate, a first gate electrode across the first active region, a first drain region adjacent to the first gate electrode, an undercut region between the first active region and the first gate electrode, and a first gate spacer on the side surface of the first gate electrode extending into the undercut region.
- The first active region is defined on a substrate.
- The first gate electrode is positioned across the first active region.
- The first drain region is located next to the first gate electrode.
- An undercut region exists between the first active region and the first gate electrode.
- A first gate spacer is present on the side surface of the first gate electrode, extending into the undercut region.
Potential applications of this technology:
- Semiconductor devices and integrated circuits
- Electronics manufacturing and fabrication
- Power electronics
- Communication systems
- Consumer electronics
Problems solved by this technology:
- Improved performance and efficiency of semiconductor devices
- Enhanced control and functionality of integrated circuits
- Reduction of power consumption and heat generation
- Increased reliability and durability of electronic components
Benefits of this technology:
- Higher speed and performance of semiconductor devices
- More precise control and operation of integrated circuits
- Lower power consumption and improved energy efficiency
- Enhanced reliability and lifespan of electronic devices
Original Abstract Submitted
A semiconductor device includes a first active region defined on a substrate, a first gate electrode across the first active region, a first drain region in the first active region at a position adjacent to the first gate electrode, an undercut region between the first active region and the first gate electrode, and a first gate spacer on a side surface of the first gate electrode and extending into the undercut region.
- SAMSUNG ELECTRONICS CO., LTD.
- Bongseok Suh of Seoul (KR)
- Daewon Kim of Hwaseong-si (KR)
- Beomjin Park of Hwaseong-si (KR)
- Sukhyung Park of Seoul (KR)
- Sungil Park of Suwon-si (KR)
- Jaehoon Shin of Suwon-si (KR)
- Bongseob Yang of Suwon-si (KR)
- Junggun You of Ansan-si (KR)
- Jaeyun Lee of Hwaseong-si (KR)
- H01L29/66
- H01L29/10
- H01L29/423
- H01L29/786