18319684. METHOD AND DEVICE FOR SIMULATING PERFORMANCE OF SEMICONDUCTOR DEVICE, AND SYSTEM AND METHOD FOR EVALUATING PERFORMANCE OF SEMICONDUCTOR DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
METHOD AND DEVICE FOR SIMULATING PERFORMANCE OF SEMICONDUCTOR DEVICE, AND SYSTEM AND METHOD FOR EVALUATING PERFORMANCE OF SEMICONDUCTOR DEVICE
Organization Name
Inventor(s)
Sung-Min Hong of Gwangju-si (KR)
METHOD AND DEVICE FOR SIMULATING PERFORMANCE OF SEMICONDUCTOR DEVICE, AND SYSTEM AND METHOD FOR EVALUATING PERFORMANCE OF SEMICONDUCTOR DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18319684 titled 'METHOD AND DEVICE FOR SIMULATING PERFORMANCE OF SEMICONDUCTOR DEVICE, AND SYSTEM AND METHOD FOR EVALUATING PERFORMANCE OF SEMICONDUCTOR DEVICE
Simplified Explanation
The abstract describes a simulation method for a semiconductor device model using an approximate Boltzmann transport equation.
- Establish a carrier distribution function of the semiconductor device model.
- Compute values corresponding to a solution of the approximate Boltzmann transport equation based on the carrier distribution function.
- Output a performance value of the semiconductor device model as a simulation result value.
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- Potential Applications
- Semiconductor device design and optimization.
- Semiconductor manufacturing process improvement.
- Problems Solved
- Efficient simulation of semiconductor device performance.
- Accurate prediction of device behavior under different conditions.
- Benefits
- Faster development of semiconductor devices.
- Cost-effective optimization of device performance.
- Enhanced understanding of carrier distribution in semiconductor devices.
Original Abstract Submitted
A simulation method includes establishing a carrier distribution function of a semiconductor device model, computing one or more values corresponding to a solution of an approximate Boltzmann transport equation with respect to the carrier distribution function, and outputting a performance value of the semiconductor device model, which corresponds to the one or more values corresponding to the solution of the approximate Boltzmann transport equation, as a simulation result value.
