View source for 18174367. NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD simplified abstract (KABUSHIKI KAISHA TOSHIBA)

=NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD=


==Organization Name==

[[:Category:KABUSHIKI KAISHA TOSHIBA|KABUSHIKI KAISHA TOSHIBA]]


[[Category:KABUSHIKI KAISHA TOSHIBA]]

==Inventor(s)==

[[:Category:Hiroshi Ohno of Tokyo (JP)|Hiroshi Ohno of Tokyo (JP)]][[Category:Hiroshi Ohno of Tokyo (JP)]]

[[:Category:Hiroya Kano of Kawasaki Kanagawa (JP)|Hiroya Kano of Kawasaki Kanagawa (JP)]][[Category:Hiroya Kano of Kawasaki Kanagawa (JP)]]

[[:Category:Hideaki Okano of Yokohama Kanagawa (JP)|Hideaki Okano of Yokohama Kanagawa (JP)]][[Category:Hideaki Okano of Yokohama Kanagawa (JP)]]

==NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18174367 titled 'NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD

==Simplified Explanation==

The patent application describes a non-transitory storage medium that stores an optical inspection program. This program allows a processor to generate a wavelength selection portion-removed image by removing the image of a wavelength selection portion from a captured image of an object surface. The wavelength selection portion is configured to select at least two different wavelength spectra from incident light.

* Explanation of the patent/innovation:
    * The innovation involves removing the image of a wavelength selection portion from a captured image of an object surface.
    * The wavelength selection portion selects at least two different wavelength spectra from incident light.
    * This process is executed by an optical inspection program stored in a non-transitory storage medium.

### Potential Applications of this Technology:
- Quality control in manufacturing processes
- Medical imaging for diagnostic purposes
- Environmental monitoring for pollution detection

### Problems Solved by this Technology:
- Accurate and precise imaging of object surfaces
- Efficient removal of unwanted image portions
- Enhanced analysis of different wavelength spectra

### Benefits of this Technology:
- Improved image processing capabilities
- Increased accuracy in inspection and analysis
- Enhanced visualization of object surfaces

### Potential Commercial Applications of this Technology:
#### Enhancing Image Processing in Optical Inspection Systems

### Possible Prior Art:
- Prior art related to image processing techniques in optical inspection systems
- Research on wavelength selection methods in imaging technologies

#### Unanswered Questions:
#### How does this technology compare to existing image processing methods in optical inspection?
This article does not provide a direct comparison with existing image processing methods in optical inspection systems. Further research or a comparative study would be needed to address this question.

#### What are the specific industries or sectors that could benefit the most from this technology?
While potential applications are mentioned, a detailed analysis of the specific industries or sectors that could benefit the most from this technology is not provided in this article. Further market research or case studies would be necessary to determine the most suitable applications.


==Original Abstract Submitted==

According to an embodiment, a non-transitory storage medium stores an optical inspection program. The optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.



[[Category:G01N21/31]]
[[Category:G06T5/00]]
[[Category:G06T5/10]]
[[Category:G06T5/20]]
[[Category:G06T7/00]]