18168504. COMPLEMENTARY FIELD EFFECT TRANSISTOR WITH CONDUCTIVE THROUGH SUBSTRATE LAYER simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)

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COMPLEMENTARY FIELD EFFECT TRANSISTOR WITH CONDUCTIVE THROUGH SUBSTRATE LAYER

Organization Name

Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor(s)

Wei-Xiang You of Hsinchu (TW)

Wei-De Ho of Hsinchu (TW)

Hsin Yang Hung of Hsinchu (TW)

Meng-Yu Lin of Hsinchu (TW)

Hsiang-Hung Huang of Hsinchu (TW)

Chun-Fu Cheng of Hsinchu (TW)

Kuan-Kan Hu of Hsinchu (TW)

Szu-Hua Chen of Hsinchu (TW)

Ting-Yun Wu of Hsinchu (TW)

Wei-Cheng Tzeng of Hsinchu (TW)

Wei-Cheng Lin of Hsinchu (TW)

Cheng-Yin Wang of Hsinchu (TW)

Jui-Chien Huang of Hsinchu (TW)

Szuya Liao of Hsinchu (TW)

COMPLEMENTARY FIELD EFFECT TRANSISTOR WITH CONDUCTIVE THROUGH SUBSTRATE LAYER - A simplified explanation of the abstract

This abstract first appeared for US patent application 18168504 titled 'COMPLEMENTARY FIELD EFFECT TRANSISTOR WITH CONDUCTIVE THROUGH SUBSTRATE LAYER

Simplified Explanation

The abstract describes a device with a complementary transistor structure, including a first transistor and a second transistor stacked on top of each other. The device also includes source/drain regions, source/drain contacts, gate isolation structure, and an interconnect structure.

  • The device includes a complementary transistor structure with overlapping source/drain regions.
  • It has source/drain contacts electrically coupled to the source/drain regions.
  • There is a gate isolation structure adjacent to the transistors.
  • An interconnect structure is electrically coupled to the source/drain contacts.
  • The interconnect structure includes a conductive layer and a dielectric layer.

Potential applications of this technology:

  • Integrated circuits
  • Semiconductor devices
  • Transistor technology

Problems solved by this technology:

  • Improved performance of complementary transistors
  • Enhanced electrical coupling between source/drain regions and contacts
  • Efficient interconnect structure design

Benefits of this technology:

  • Higher efficiency in electronic devices
  • Better integration of components in semiconductor devices
  • Enhanced overall performance of the device


Original Abstract Submitted

A device includes: a complementary transistor including: a first transistor having a first source/drain region and a second source/drain region; and a second transistor stacked on the first transistor, and having a third source/drain region and a fourth source/drain region, the third source/drain region overlapping the first source/drain region, the fourth source/drain region overlapping the second source/drain region. The device further includes: a first source/drain contact electrically coupled to the third source/drain region; a second source/drain contact electrically coupled to the second source/drain region; a gate isolation structure adjacent the first and second transistors; and an interconnect structure electrically coupled to the first source/drain contact and the second source/drain contact. The interconnect structure includes: a conductive layer in contact with the first source/drain contact and the second source/drain contact, the conductive layer being in the gate isolation structure; an opening in the conductive layer, the opening overlapping the fourth source/drain region, the second source/drain region or both; and a dielectric layer in the opening and on the conductive layer in the gate isolation structure.