18129414. SYSTEMS AND METHODS FOR TESTING CXL ENABLED DEVICES IN PARALLEL simplified abstract (ADVANTEST CORPORATION)
Contents
- 1 SYSTEMS AND METHODS FOR TESTING CXL ENABLED DEVICES IN PARALLEL
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SYSTEMS AND METHODS FOR TESTING CXL ENABLED DEVICES IN PARALLEL - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 How does this technology compare to existing testing systems in terms of scalability and performance testing capabilities?
- 1.11 What are the potential limitations or challenges in implementing this testing system in real-world scenarios?
- 1.12 Original Abstract Submitted
SYSTEMS AND METHODS FOR TESTING CXL ENABLED DEVICES IN PARALLEL
Organization Name
Inventor(s)
Srdjan Malisic of San Jose CA (US)
SYSTEMS AND METHODS FOR TESTING CXL ENABLED DEVICES IN PARALLEL - A simplified explanation of the abstract
This abstract first appeared for US patent application 18129414 titled 'SYSTEMS AND METHODS FOR TESTING CXL ENABLED DEVICES IN PARALLEL
Simplified Explanation
Efficient and effective testing systems and methods are presented in the patent application. The system includes a user interface, a test board, and a tester for testing a plurality of devices under test (DUTs) that are compute express link (CXL) protocol compliant. The tester manages flexible and independent parallel testing across the DUTs, generating and managing workloads independently for each DUT.
- User interface for user interaction
- Test board for communication with DUTs
- Tester for directing testing of DUTs
- Flexible and independent parallel testing
- Workload generation and management for each DUT
- Memory devices testing in parallel
- Performance testing including bandwidth, latency, and error testing
Potential Applications
This technology can be applied in various industries such as semiconductor manufacturing, computer hardware testing, and data center management.
Problems Solved
This technology solves the problem of efficiently testing multiple devices simultaneously, reducing testing time and increasing productivity.
Benefits
The benefits of this technology include improved testing efficiency, faster identification of issues, and enhanced performance evaluation of devices.
Potential Commercial Applications
Potential commercial applications of this technology include semiconductor testing equipment, computer hardware testing tools, and data center testing systems.
Possible Prior Art
One possible prior art in this field is the use of automated testing systems for semiconductor devices, but the specific implementation of flexible and independent parallel testing across multiple devices may be a novel aspect of this technology.
Unanswered Questions
How does this technology compare to existing testing systems in terms of scalability and performance testing capabilities?
The article does not provide a direct comparison with existing testing systems in terms of scalability and performance testing capabilities. It would be helpful to understand how this technology stands out in these aspects.
What are the potential limitations or challenges in implementing this testing system in real-world scenarios?
The article does not address potential limitations or challenges in implementing this testing system in real-world scenarios. It would be important to know if there are any obstacles to widespread adoption of this technology.
Original Abstract Submitted
Efficient and effective testing systems and methods are presented. In one embodiment, a test system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester manages testing of the plurality of DUTs, including managing flexible and independent parallel testing across the plurality of DUTs. In one exemplary implementation, the tester generates and manages workloads independently for DUTs included in the plurality of DUTs. The DUTs can be memory devices the tester is configured to test different memory spaces in parallel. The different memory spaces can have various implementations (e.g., included in the plurality of DUTs, different memory spaces are within one of the DUTs included in the plurality of DUTs, etc.). Workloads can be generated based upon individual characteristics of the DUTS and managed separately. The testing can include performance testing. (e.g., bandwidth testing, latency testing, error testing, etc.).
