17963341. SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK simplified abstract (HUAWEI TECHNOLOGIES CO., LTD.)
Contents
- 1 SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK
Organization Name
Inventor(s)
SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK - A simplified explanation of the abstract
This abstract first appeared for US patent application 17963341 titled 'SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK
Simplified Explanation
The disclosed systems and methods for detecting a location of reflection in an optical link involve receiving an optical signal, receiving a plurality of first type of delayed optical signals corresponding to the optical signal, determining first type of time delays associated with each of the delayed optical signals, receiving a plurality of second type of delayed optical signals corresponding to the optical signal, determining second type of time delays associated with the delayed optical signals, computing relative delays from the second type of time delays, comparing the relative delays with the first type of time delays, and determining a location of a given optical element contributing to the reflections based on the relative delay and the location of the AR.
- Receiving an optical signal
- Receiving delayed optical signals of two types
- Determining time delays associated with each type of delayed signals
- Computing relative delays
- Comparing relative delays with the time delays
- Determining the location of the optical element contributing to reflections
Potential Applications
This technology can be applied in:
- Optical communication systems
- Fiber optic networks
- Data centers
Problems Solved
This technology helps in:
- Identifying locations of reflections in optical links
- Improving signal quality in optical communication
- Enhancing the performance of fiber optic networks
Benefits
The benefits of this technology include:
- Increased efficiency in detecting reflection locations
- Improved reliability of optical communication systems
- Enhanced data transmission speeds
Potential Commercial Applications
The potential commercial applications of this technology include:
- Optical network equipment manufacturing
- Telecommunication companies
- Data center infrastructure providers
Possible Prior Art
One possible prior art in this field is the use of optical time-domain reflectometry (OTDR) for locating faults in optical fibers. OTDR is commonly used for testing and troubleshooting fiber optic networks.
Unanswered Questions
How does this technology compare to existing methods of reflection detection in optical links?
This article does not provide a direct comparison with other methods or technologies for detecting reflection locations in optical links.
What are the limitations of this technology in terms of detecting reflection locations accurately?
The article does not address any potential limitations or challenges that may arise when using this technology for detecting reflection locations in optical links.
Original Abstract Submitted
The disclosed systems and methods for detecting a location of reflection in an optical link comprising: i) receiving an optical signal; ii) receiving a plurality of first type of delayed optical signals corresponding to the optical signal; iii) determining a first type of time delays associated with each of the plurality of first type of delayed optical signals; iv) receiving a plurality of second type of delayed optical signals corresponding to the optical signal; v) determining a second type of time delays associated with the each of the plurality of second type of delayed optical signals; vi) computing relative delays from the second type of time delays; vii) comparing the relative delays with the first type of time delays; and viii) determining a location of a given optical element contributing to the reflections based on the given relative delay and the location of the AR.
