17876453. OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING simplified abstract (NEC Corporation)

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OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING

Organization Name

NEC Corporation

Inventor(s)

John Kenji David Clark of Tokyo (JP)

Shigeru Nakamura of Tokyo (JP)

OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING - A simplified explanation of the abstract

This abstract first appeared for US patent application 17876453 titled 'OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING

Simplified Explanation

The abstract describes a patent application for a swept-source optical coherence tomography (SS-OCT) apparatus. This apparatus includes multiple light sources that can be tuned to different wavelengths. The apparatus also includes optical couplers that split the light output from the sources into a reference optical path and a sample optical path. The sample optical path is used to illuminate a sample. Return optical signals from both the reference and sample optical paths are received by a second optical coupler, which outputs an optical interference signal. This signal is then detected by a detector, and an electrical signal based on the detected interference signal is received by a controller. The controller generates a depth profile of the sample using compressed sensing.

  • The patent application is for a swept-source optical coherence tomography (SS-OCT) apparatus.
  • The apparatus includes multiple wavelength-tunable light sources.
  • An optical coupler splits the light output from the sources into a reference optical path and a sample optical path.
  • The sample optical path is used to illuminate a sample.
  • A second optical coupler receives return optical signals from both the reference and sample optical paths and outputs an optical interference signal.
  • A detector detects the optical interference signal.
  • A controller receives an electrical signal based on the detected interference signal.
  • The controller generates a depth profile of the sample using compressed sensing.

Potential applications of this technology:

  • Medical imaging: SS-OCT can be used for non-invasive imaging of biological tissues, such as the retina, skin, and blood vessels.
  • Industrial inspection: SS-OCT can be used for quality control and inspection of materials, such as semiconductor wafers and coatings.
  • Art restoration: SS-OCT can be used to analyze and restore historical artworks by providing detailed information about the layers and structures within the artwork.

Problems solved by this technology:

  • Non-invasive imaging: SS-OCT provides a non-invasive method for imaging biological tissues, reducing the need for invasive procedures.
  • High-resolution imaging: SS-OCT allows for high-resolution imaging of structures within samples, providing detailed information for analysis and diagnosis.
  • Real-time imaging: The use of compressed sensing allows for faster image acquisition and real-time imaging, enabling dynamic imaging of moving samples.

Benefits of this technology:

  • Improved diagnosis: SS-OCT provides detailed information about the structure and composition of tissues, aiding in the diagnosis of diseases and conditions.
  • Non-destructive testing: SS-OCT allows for non-destructive testing of materials, reducing waste and cost in industrial applications.
  • Preservation of cultural heritage: SS-OCT can be used to analyze and preserve historical artifacts and artworks without causing damage.


Original Abstract Submitted

A swept-source optical coherence tomography (SS-OCT) apparatus includes a plurality of wavelength-tunable light sources. The SS-OCT apparatus includes a first optical coupler configured to receive an output from each of the plurality of wavelength-tunable light sources. The optical coupler is configured to split the received output from the plurality of wavelength-tunable light sources into a reference optical path and a sample optical path. The sample optical path is configured to illuminate a sample. The SS-OCT apparatus includes a second optical coupler configured to receive return optical signals from the reference optical path and the sample optical path, and to output an optical interference signal. The SS-OCT apparatus includes a detector configured to detect the optical interference signal; and a controller configured to receive an electrical signal based on the detected optical interference signal. The controller is configured to generate a depth profile of the sample using compressed sensing.

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