17838298. SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
- 1 SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Original Abstract Submitted
SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL
Organization Name
Inventor(s)
Seaeun Park of Hwaseong-si (KR)
SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL - A simplified explanation of the abstract
This abstract first appeared for US patent application 17838298 titled 'SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL
Simplified Explanation
The abstract describes a simulation method and system for verifying the operation of a semiconductor memory device at a design level. The method involves setting the configuration and arrangement of a registered clock driver (RCD) and semiconductor memory devices on a printed circuit board (PCB) through a graphic user interface (GUI). A test program is then executed to apply control signals to the PCB and compare them with the control signals output by the RCD. The results of the test are recorded, and if the RCD operates normally, a test is performed on the memory module.
- The simulation method verifies the operation of a semiconductor memory device at a design level.
- The configuration and arrangement of the RCD and semiconductor memory devices on the PCB are set through a GUI.
- A test program is executed to apply control signals to the PCB and compare them with the control signals output by the RCD.
- The results of the test are recorded, and if the RCD operates normally, a test is performed on the memory module.
Potential Applications
- This technology can be used in the design and development of semiconductor memory devices.
- It can be applied in the manufacturing process to ensure the proper functioning of memory modules.
- The simulation method can be used for quality control and testing purposes in the semiconductor industry.
Problems Solved
- The simulation method solves the problem of verifying the operation of a semiconductor memory device at a design level.
- It helps identify any issues or malfunctions in the registered clock driver and memory devices on the PCB.
- By comparing the applied control signals with the output signals, any discrepancies or errors can be detected and addressed.
Benefits
- The simulation method provides a systematic and efficient way to verify the operation of semiconductor memory devices.
- It allows for easy configuration and arrangement of the registered clock driver and memory devices through a user-friendly GUI.
- By identifying and addressing any issues early on, the technology helps improve the overall quality and reliability of memory modules.
Original Abstract Submitted
A simulation method and system of verifying an operation of a semiconductor memory device of a memory module at a design level. The simulation method includes setting a configuration and an arrangement of a registered clock driver (RCD) and a configuration and an arrangement of first semiconductor memory devices to fourth semiconductor memory devices, on a printed circuit board (PCB) through a graphic user interface (GUI). When a RCD test execution command is applied through the GUI, executing a test program to apply control signals to control signal terminals of the PCB based on a command truth table, to compare the applied control signals and control signals output through first driver output terminals of the RCD, and to create an RCD test result. When the RCD operates normally, performing a test on the memory module.
