18151609. 3DIC Package and Method Forming the Same simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)

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3DIC Package and Method Forming the Same

Organization Name

Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor(s)

Ching-Yu Huang of Hsinchu (TW)

Kuo-Chiang Ting of Hsinchu (TW)

Ting-Chu Ko of Hsinchu (TW)

3DIC Package and Method Forming the Same - A simplified explanation of the abstract

This abstract first appeared for US patent application 18151609 titled '3DIC Package and Method Forming the Same

Simplified Explanation

- Method involves bonding a first device die to a second device die through face-to-face bonding. - Forming a gap-filling region to encircle the first device die. - Performing a backside-grinding process on the device wafer to reveal a through-via in the second device die. - Forming a redistribution structure on the backside of the device wafer, electrically connected to the first device die through the through-via in the second device die. - Bonding a supporting substrate to the first device die.

Potential Applications

- Semiconductor industry for advanced packaging technologies. - Microelectronics for creating complex integrated circuits.

Problems Solved

- Enhances electrical connectivity between device dies. - Improves thermal management and reliability of the devices.

Benefits

- Enables higher performance and functionality in electronic devices. - Enhances miniaturization and integration capabilities in semiconductor devices.


Original Abstract Submitted

A method includes bonding a first device die to a second device die through face-to-face bonding, wherein the second device die is in a device wafer, forming a gap-filling region to encircle the first device die, performing a backside-grinding process on the device wafer to reveal a through-via in the second device die, and forming a redistribution structure on the backside of the device wafer. The redistribution structure is electrically connected to the first device die through the through-via in the second device die. A supporting substrate is bonded to the first device die.