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Bibliographic details for Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract

Citation styles for Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract

APA style

Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract. (2024, April 11). WikiPatents, . Retrieved 11:59, June 8, 2024 from http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833.

MLA style

"Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract." WikiPatents, . 11 Apr 2024, 04:20 UTC. 8 Jun 2024, 11:59 <http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833>.

MHRA style

WikiPatents contributors, 'Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract', WikiPatents, , 11 April 2024, 04:20 UTC, <http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833> [accessed 8 June 2024]

Chicago style

WikiPatents contributors, "Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833 (accessed June 8, 2024).

CBE/CSE style

WikiPatents contributors. Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract [Internet]. WikiPatents, ; 2024 Apr 11, 04:20 UTC [cited 2024 Jun 8]. Available from: http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833.

Bluebook style

Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract, http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833 (last visited June 8, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833",
   note = "[Online; accessed 8-June-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=Samsung_display_co.,_ltd._(20240102942)._DEFECT_ANALYSIS_DEVICE_AND_DEFECT_ANALYSIS_METHOD_USING_THE_SAME_simplified_abstract&oldid=47833}",
   note = "[Online; accessed 8-June-2024]"
 }


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