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Bibliographic details for US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract

Citation styles for US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract

APA style

US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract. (2023, October 23). WikiPatents, . Retrieved 07:34, June 10, 2024 from http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759.

MLA style

"US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract." WikiPatents, . 23 Oct 2023, 15:14 UTC. 10 Jun 2024, 07:34 <http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759>.

MHRA style

WikiPatents contributors, 'US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract', WikiPatents, , 23 October 2023, 15:14 UTC, <http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759> [accessed 10 June 2024]

Chicago style

WikiPatents contributors, "US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759 (accessed June 10, 2024).

CBE/CSE style

WikiPatents contributors. US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract [Internet]. WikiPatents, ; 2023 Oct 23, 15:14 UTC [cited 2024 Jun 10]. Available from: http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759.

Bluebook style

US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract, http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759 (last visited June 10, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract --- WikiPatents{,} ",
   year = "2023",
   url = "http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759",
   note = "[Online; accessed 10-June-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "US Patent Application 18102514. APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE simplified abstract --- WikiPatents{,} ",
   year = "2023",
   url = "\url{http://wikipatents.org/index.php?title=US_Patent_Application_18102514._APPARATUS_AND_METHOD_FOR_INSPECTING_AND_MEASURING_SEMICONDUCTOR_DEVICE_simplified_abstract&oldid=3759}",
   note = "[Online; accessed 10-June-2024]"
 }


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