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Bibliographic details for 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- Page name: 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 22 January 2024 03:56 UTC
- Date retrieved: 2 June 2024 18:32 UTC
- Permanent URL: http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920
- Page Version ID: 28920
Citation styles for 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
APA style
18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.). (2024, January 22). WikiPatents, . Retrieved 18:32, June 2, 2024 from http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920.
MLA style
"18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)." WikiPatents, . 22 Jan 2024, 03:56 UTC. 2 Jun 2024, 18:32 <http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920>.
MHRA style
WikiPatents contributors, '18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)', WikiPatents, , 22 January 2024, 03:56 UTC, <http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920> [accessed 2 June 2024]
Chicago style
WikiPatents contributors, "18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)," WikiPatents, , http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920 (accessed June 2, 2024).
CBE/CSE style
WikiPatents contributors. 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.) [Internet]. WikiPatents, ; 2024 Jan 22, 03:56 UTC [cited 2024 Jun 2]. Available from: http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920.
Bluebook style
18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.), http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920 (last visited June 2, 2024).
BibTeX entry
@misc{ wiki:xxx,
author = "WikiPatents",
title = "18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ",
year = "2024",
url = "http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920",
note = "[Online; accessed 2-June-2024]"
}
When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx,
author = "WikiPatents",
title = "18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ",
year = "2024",
url = "\url{http://wikipatents.org/index.php?title=18219494._SUBSTRATE_INSPECTION_METHOD_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=28920}",
note = "[Online; accessed 2-June-2024]"
}
