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Bibliographic details for 20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA)
- Page name: 20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 19 January 2024 10:23 UTC
- Date retrieved: 6 June 2024 10:15 UTC
- Permanent URL: http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638
- Page Version ID: 28638
Citation styles for 20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA)
APA style
20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA). (2024, January 19). WikiPatents, . Retrieved 10:15, June 6, 2024 from http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638.
MLA style
"20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA)." WikiPatents, . 19 Jan 2024, 10:23 UTC. 6 Jun 2024, 10:15 <http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638>.
MHRA style
WikiPatents contributors, '20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA)', WikiPatents, , 19 January 2024, 10:23 UTC, <http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638> [accessed 6 June 2024]
Chicago style
WikiPatents contributors, "20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA)," WikiPatents, , http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638 (accessed June 6, 2024).
CBE/CSE style
WikiPatents contributors. 20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA) [Internet]. WikiPatents, ; 2024 Jan 19, 10:23 UTC [cited 2024 Jun 6]. Available from: http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638.
Bluebook style
20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA), http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638 (last visited June 6, 2024).
BibTeX entry
@misc{ wiki:xxx,
author = "WikiPatents",
title = "20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA) --- WikiPatents{,} ",
year = "2024",
url = "http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638",
note = "[Online; accessed 6-June-2024]"
}
When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx,
author = "WikiPatents",
title = "20240020821. DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION COMPUTER PROGRAM PRODUCT simplified abstract (KABUSHIKI KAISHA TOSHIBA) --- WikiPatents{,} ",
year = "2024",
url = "\url{http://wikipatents.org/index.php?title=20240020821._DEFECT_INSPECTION_DEVICE,_DEFECT_INSPECTION_METHOD,_AND_DEFECT_INSPECTION_COMPUTER_PROGRAM_PRODUCT_simplified_abstract_(KABUSHIKI_KAISHA_TOSHIBA)&oldid=28638}",
note = "[Online; accessed 6-June-2024]"
}
