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Bibliographic details for 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- Page name: 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 2 January 2024 17:51 UTC
- Date retrieved: 2 June 2024 19:00 UTC
- Permanent URL: http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288
- Page Version ID: 21288
Citation styles for 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
APA style
17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.). (2024, January 2). WikiPatents, . Retrieved 19:00, June 2, 2024 from http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288.
MLA style
"17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)." WikiPatents, . 2 Jan 2024, 17:51 UTC. 2 Jun 2024, 19:00 <http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288>.
MHRA style
WikiPatents contributors, '17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)', WikiPatents, , 2 January 2024, 17:51 UTC, <http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288> [accessed 2 June 2024]
Chicago style
WikiPatents contributors, "17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)," WikiPatents, , http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288 (accessed June 2, 2024).
CBE/CSE style
WikiPatents contributors. 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) [Internet]. WikiPatents, ; 2024 Jan 2, 17:51 UTC [cited 2024 Jun 2]. Available from: http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288.
Bluebook style
17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.), http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288 (last visited June 2, 2024).
BibTeX entry
@misc{ wiki:xxx, author = "WikiPatents", title = "17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ", year = "2024", url = "http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288", note = "[Online; accessed 2-June-2024]" }
When using the LaTeX package url (\usepackage{url}
somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx, author = "WikiPatents", title = "17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ", year = "2024", url = "\url{http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288}", note = "[Online; accessed 2-June-2024]" }