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Bibliographic details for 17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

Citation styles for 17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

APA style

17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.). (2024, January 2). WikiPatents, . Retrieved 03:21, May 29, 2024 from http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292.

MLA style

"17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)." WikiPatents, . 2 Jan 2024, 02:33 UTC. 29 May 2024, 03:21 <http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292>.

MHRA style

WikiPatents contributors, '17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)', WikiPatents, , 2 January 2024, 02:33 UTC, <http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292> [accessed 29 May 2024]

Chicago style

WikiPatents contributors, "17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)," WikiPatents, , http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292 (accessed May 29, 2024).

CBE/CSE style

WikiPatents contributors. 17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) [Internet]. WikiPatents, ; 2024 Jan 2, 02:33 UTC [cited 2024 May 29]. Available from: http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292.

Bluebook style

17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.), http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292 (last visited May 29, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292",
   note = "[Online; accessed 29-May-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "17714494. WAFER MAP ANALYSIS SYSTEM USING NEURAL NETWORK AND METHOD OF ANALYZING WAFER MAP USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=17714494._WAFER_MAP_ANALYSIS_SYSTEM_USING_NEURAL_NETWORK_AND_METHOD_OF_ANALYZING_WAFER_MAP_USING_THE_SAME_simplified_abstract_(SAMSUNG_ELECTRONICS_CO.,_LTD.)&oldid=19292}",
   note = "[Online; accessed 29-May-2024]"
 }


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