View source for Kabushiki kaisha toshiba (20240094114). OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM simplified abstract

=OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM=


==Organization Name==

[[:Category:kabushiki kaisha toshiba|kabushiki kaisha toshiba]]


[[Category:kabushiki kaisha toshiba]]

==Inventor(s)==

[[:Category:Hiroshi Ohno of Tokyo (JP)|Hiroshi Ohno of Tokyo (JP)]][[Category:Hiroshi Ohno of Tokyo (JP)]]

[[:Category:Hiroya Kano of Kawasaki Kanagawa (JP)|Hiroya Kano of Kawasaki Kanagawa (JP)]][[Category:Hiroya Kano of Kawasaki Kanagawa (JP)]]

[[:Category:Hideaki Okano of Yokohama Kanagawa (JP)|Hideaki Okano of Yokohama Kanagawa (JP)]][[Category:Hideaki Okano of Yokohama Kanagawa (JP)]]

==OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240094114 titled 'OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM

==Simplified Explanation==

The optical inspection apparatus described in the abstract includes an illumination portion, a wavelength selection portion, and an imaging portion. The apparatus illuminates different points on an object's surface with specific light, then images the light reflected from these points through a wavelength selection process.

* Illumination portion: Emits first and second illumination light to illuminate specific points on the object's surface.
* Wavelength selection portion: Filters and selects light based on the direction of the illumination and the normal direction at the object points.
* Imaging portion: Captures and processes the light reflected from the object points after passing through the wavelength selection portion.

== Potential Applications ==
This technology can be applied in various industries such as:
* Quality control in manufacturing processes
* Surface inspection in semiconductor production
* Defect detection in material analysis

== Problems Solved ==
The optical inspection apparatus helps in:
* Identifying defects or irregularities on object surfaces
* Ensuring product quality and consistency
* Streamlining inspection processes for efficiency

== Benefits ==
The benefits of this technology include:
* Improved accuracy and precision in surface inspection
* Faster and more reliable defect detection
* Enhanced quality control measures in production lines

== Potential Commercial Applications ==
This technology can be commercially utilized in:
* Automotive manufacturing for quality assurance
* Electronics industry for component inspection
* Pharmaceutical sector for packaging quality control

== Possible Prior Art ==
One possible prior art for this technology could be the use of similar optical inspection systems in the semiconductor industry for defect detection and quality control.

=== Unanswered Questions ===

=== How does this technology compare to traditional inspection methods? ===
This technology offers higher precision and accuracy compared to traditional visual inspection methods. It can detect defects that may not be visible to the naked eye, leading to improved quality control processes.

=== What are the limitations of this optical inspection apparatus? ===
One limitation of this technology could be its sensitivity to environmental factors such as ambient light or surface reflections, which may affect the accuracy of the inspection results. Regular calibration and maintenance may be required to address these issues.


==Original Abstract Submitted==

according to an embodiment, an optical inspection apparatus includes: an illumination portion, a wavelength selection portion and an imaging portion. the illumination portion irradiates a first object point of a surface of an object with first illumination light, and a second object point of the surface of the object with second illumination light. the imaging portion images light from the first object point through the wavelength selection portion when a normal direction at the first object point and a direction of the first illumination light have an opposing relationship, and images light from the second object point through the wavelength selection portion when a normal direction at the second object point and a direction of the second illumination light have an opposing relationship.



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