View source for 20240087149.Pattern-based depth mapping with extended reference image simplified abstract (apple inc.)

=Pattern-based depth mapping with extended reference image=


==Organization Name==

[[:Category:apple inc.|apple inc.]]


[[Category:apple inc.]]

==Inventor(s)==

[[:Category:Shay Yosub of Kfar Yehezkel (IL)|Shay Yosub of Kfar Yehezkel (IL)]][[Category:Shay Yosub of Kfar Yehezkel (IL)]]

[[:Category:Noam Badt of Tel Aviv (IL)|Noam Badt of Tel Aviv (IL)]][[Category:Noam Badt of Tel Aviv (IL)]]

[[:Category:Boris Morgenstein of Tel Aviv (IL)|Boris Morgenstein of Tel Aviv (IL)]][[Category:Boris Morgenstein of Tel Aviv (IL)]]

[[:Category:Yuval Vardi of Tel Aviv (IL)|Yuval Vardi of Tel Aviv (IL)]][[Category:Yuval Vardi of Tel Aviv (IL)]]

[[:Category:David Pawlowski of Tel Aviv (IL)|David Pawlowski of Tel Aviv (IL)]][[Category:David Pawlowski of Tel Aviv (IL)]]

[[:Category:Assaf Avraham of Givatayim (IL)|Assaf Avraham of Givatayim (IL)]][[Category:Assaf Avraham of Givatayim (IL)]]

[[:Category:Pieter Spinnewyn of Los Gatos CA (US)|Pieter Spinnewyn of Los Gatos CA (US)]][[Category:Pieter Spinnewyn of Los Gatos CA (US)]]

[[:Category:Tom Levy of Holon (IL)|Tom Levy of Holon (IL)]][[Category:Tom Levy of Holon (IL)]]

[[:Category:Yohai Zmora of San Francisco CA (US)|Yohai Zmora of San Francisco CA (US)]][[Category:Yohai Zmora of San Francisco CA (US)]]

==Pattern-based depth mapping with extended reference image - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240087149 titled 'Pattern-based depth mapping with extended reference image

==Simplified Explanation==

The patent application describes a method for depth mapping using a projector and a camera to capture images of a target area.

* The depth mapping device includes a projector that projects a pattern onto a target area and a camera that captures images of the target area.
* The projector projects the pattern at different distances from the camera, and the camera captures reference images containing parts of the pattern on different planes.
* The reference images are combined to produce an extended reference image with the complete pattern for depth mapping.

== Potential Applications ==
This technology could be used in:
* 3D scanning and modeling
* Augmented reality applications
* Robotics for object detection and navigation

== Problems Solved ==
* Accurate depth mapping of objects in a target area
* Improved spatial awareness for various applications
* Enhanced image processing capabilities

== Benefits ==
* Precise depth mapping for better object recognition
* Increased accuracy in spatial measurements
* Enhanced visualization in augmented reality applications

== Potential Commercial Applications ==
* Consumer electronics for augmented reality devices
* Industrial automation for object detection and tracking systems
* Medical imaging for 3D scanning and modeling applications

== Possible Prior Art ==
One possible prior art for this technology could be the use of structured light techniques for depth mapping in computer vision systems.

=== What are the limitations of this technology in real-world applications? ===

The limitations of this technology in real-world applications may include:
* Limited accuracy in depth mapping for complex or reflective surfaces
* Challenges in calibration and alignment of the projector and camera system

=== How does this technology compare to other depth mapping methods currently available? ===

This technology offers:
* Improved accuracy and precision in depth mapping
* Enhanced flexibility in capturing images at different distances
* Potential for real-time depth mapping applications


==Original Abstract Submitted==

a method for depth mapping includes providing a depth mapping device comprising a projector, which is configured to project a pattern of optical radiation onto a target area over a first field of view about a projection axis, and a camera, which is configured to capture images of the target area within a second field of view, narrower than the first field of view, about a camera axis, which is offset transversely relative to the projection axis. the projector projects the pattern onto first and second planes at first and second distances from the camera, and the camera captures first and second reference images containing first and second parts of the pattern on the first and second planes, respectively. the first and second reference images are combined to produce an extended reference image including both the first and second parts of the pattern.



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