View source for 18276098. VIBRATING SAMPLE MAGNETOMETER AND MEASUREMENT METHOD OF MAGNETIC PROPERTY simplified abstract (Mitsubishi Electric Corporation)

=VIBRATING SAMPLE MAGNETOMETER AND MEASUREMENT METHOD OF MAGNETIC PROPERTY=


==Organization Name==

[[:Category:Mitsubishi Electric Corporation|Mitsubishi Electric Corporation]]


[[Category:Mitsubishi Electric Corporation]]

==Inventor(s)==

[[:Category:Norihisa Matsumoto of Tokyo (JP)|Norihisa Matsumoto of Tokyo (JP)]][[Category:Norihisa Matsumoto of Tokyo (JP)]]

==VIBRATING SAMPLE MAGNETOMETER AND MEASUREMENT METHOD OF MAGNETIC PROPERTY - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18276098 titled 'VIBRATING SAMPLE MAGNETOMETER AND MEASUREMENT METHOD OF MAGNETIC PROPERTY

==Simplified Explanation==

The magnetic property acquisition unit detects induced voltage from a vibrating magnetized sample and acquires a magnetic property indicating the relationship between magnetic flux density and external magnetic field.

* The unit sets a sweep start value for magnetic field when pressure is applied to the sample, sweeping with a field equal to or less than this value.
* The sweep start value is smaller than the value acquired before pressure is applied, corresponding to the saturation magnetic flux density of the sample without pressure.

== Potential Applications ==
This technology can be applied in various fields such as material science, quality control, and non-destructive testing.

== Problems Solved ==
This technology allows for the accurate measurement of magnetic properties under pressure, providing valuable insights into the behavior of magnetized samples in different conditions.

== Benefits ==
The technology offers a precise and reliable method for studying the magnetic properties of materials under varying pressures, leading to improved understanding and control of magnetization processes.

== Potential Commercial Applications ==
One potential commercial application of this technology could be in the manufacturing industry for quality control of magnetized components.

== Possible Prior Art ==
Prior art in the field of magnetic property measurement under pressure includes studies on the effects of pressure on magnetic materials and devices.

=== Unanswered Questions ===

=== How does this technology compare to traditional methods of measuring magnetic properties under pressure? ===
This technology offers a more precise and controlled approach to studying the effects of pressure on magnetized samples compared to traditional methods, which may involve manual adjustments and less accurate measurements.

=== What are the limitations of this technology in real-world applications? ===
One limitation of this technology could be the complexity of the setup required for measuring magnetic properties under pressure, which may limit its practicality in certain industrial settings.


==Original Abstract Submitted==

A magnetic property acquisition unit detects an induced voltage caused by vibration of a measurement sample magnetized by an excitation electromagnet and acquires a magnetic property that indicates a relationship between a magnetic flux density and an external magnetic field. The magnetic flux density is a sum of magnetization of the measurement sample and the external magnetic field. When acquiring the magnetic property of the measurement sample to which pressure is being applied, a control device sets a first magnetic field value as a sweep start value, and performs sweeping with a magnetic field equal to or less than the first magnetic field value. The first magnetic field value is smaller than a second magnetic field value that is acquired before the pressure is applied to the measurement sample, and corresponds to a saturation magnetic flux density of the measurement sample to which the pressure is not being applied.



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