View source for 18174708. OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM simplified abstract (KABUSHIKI KAISHA TOSHIBA)

=OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM=


==Organization Name==

[[:Category:KABUSHIKI KAISHA TOSHIBA|KABUSHIKI KAISHA TOSHIBA]]


[[Category:KABUSHIKI KAISHA TOSHIBA]]

==Inventor(s)==

[[:Category:Hiroshi Ohno of Tokyo (JP)|Hiroshi Ohno of Tokyo (JP)]][[Category:Hiroshi Ohno of Tokyo (JP)]]

[[:Category:Hiroya Kano of Kawasaki Kanagawa (JP)|Hiroya Kano of Kawasaki Kanagawa (JP)]][[Category:Hiroya Kano of Kawasaki Kanagawa (JP)]]

[[:Category:Hideaki Okano of Yokohama Kanagawa (JP)|Hideaki Okano of Yokohama Kanagawa (JP)]][[Category:Hideaki Okano of Yokohama Kanagawa (JP)]]

==OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18174708 titled 'OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM

==Simplified Explanation==

The optical inspection apparatus described in the patent application includes an illumination portion, a wavelength selection portion, and an imaging portion. The apparatus is designed to illuminate different points on an object's surface with specific light and then capture images based on the relationship between the direction of illumination and the normal direction at each point.

* Illumination portion: Emits first and second illumination light to illuminate specific points on the object's surface.
* Wavelength selection portion: Selects and filters light from the illuminated points based on the relationship between the direction of illumination and the normal direction.
* Imaging portion: Captures images of the object based on the filtered light from the illuminated points.

== Potential Applications ==
This technology can be applied in various industries such as manufacturing, quality control, and material inspection where precise imaging and analysis of object surfaces are required.

== Problems Solved ==
1. Enables precise imaging of object surfaces based on the relationship between illumination direction and normal direction.
2. Provides a method for selective imaging of specific points on an object's surface for detailed analysis.

== Benefits ==
1. Improved accuracy in surface inspection and defect detection.
2. Enhanced imaging capabilities for complex objects with varying surface properties.

== Potential Commercial Applications ==
"Advanced Optical Inspection Technology for Surface Analysis"

== Possible Prior Art ==
There may be prior art related to optical inspection systems that use specific illumination techniques for surface analysis, but further research is needed to identify specific examples.

=== Unanswered Questions ===

== How does this technology compare to existing optical inspection methods in terms of speed and accuracy? ==
The patent application does not provide specific details on the performance comparison with existing optical inspection methods.

== What are the potential limitations or challenges in implementing this technology in real-world applications? ==
The patent application does not address potential challenges or limitations that may arise during the implementation of this technology.


==Original Abstract Submitted==

According to an embodiment, an optical inspection apparatus includes: an illumination portion, a wavelength selection portion and an imaging portion. The illumination portion irradiates a first object point of a surface of an object with first illumination light, and a second object point of the surface of the object with second illumination light. The imaging portion images light from the first object point through the wavelength selection portion when a normal direction at the first object point and a direction of the first illumination light have an opposing relationship, and images light from the second object point through the wavelength selection portion when a normal direction at the second object point and a direction of the second illumination light have an opposing relationship.



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