View source for 17883718. METHODS AND TOOLS FOR PREVENTING THE COUNTERFEITING AND TAMPERING OF SEMICONDUCTOR DEVICES simplified abstract (Intel Corporation)

=METHODS AND TOOLS FOR PREVENTING THE COUNTERFEITING AND TAMPERING OF SEMICONDUCTOR DEVICES=


==Organization Name==

[[:Category:Intel Corporation|Intel Corporation]]


[[Category:Intel Corporation]]

==Inventor(s)==

[[:Category:Michael A. Schroeder of Chandler AZ (US)|Michael A. Schroeder of Chandler AZ (US)]][[Category:Michael A. Schroeder of Chandler AZ (US)]]

[[:Category:Sean Bushell of Peoria AZ (US)|Sean Bushell of Peoria AZ (US)]][[Category:Sean Bushell of Peoria AZ (US)]]

[[:Category:William F. Herrington of Scottsdale AZ (US)|William F. Herrington of Scottsdale AZ (US)]][[Category:William F. Herrington of Scottsdale AZ (US)]]

[[:Category:Hannah Rowe of Chandler AZ (US)|Hannah Rowe of Chandler AZ (US)]][[Category:Hannah Rowe of Chandler AZ (US)]]

[[:Category:Sarah Shahraini of Newcastle WA (US)|Sarah Shahraini of Newcastle WA (US)]][[Category:Sarah Shahraini of Newcastle WA (US)]]

[[:Category:Ryan Pate of Gilbert AZ (US)|Ryan Pate of Gilbert AZ (US)]][[Category:Ryan Pate of Gilbert AZ (US)]]

[[:Category:Erasenthiran Poonjolai of Chandler AZ (US)|Erasenthiran Poonjolai of Chandler AZ (US)]][[Category:Erasenthiran Poonjolai of Chandler AZ (US)]]

[[:Category:Saikumar Jayaraman of Chandler AZ (US)|Saikumar Jayaraman of Chandler AZ (US)]][[Category:Saikumar Jayaraman of Chandler AZ (US)]]

[[:Category:Fariaz Karim of GILBERT AZ (US)|Fariaz Karim of GILBERT AZ (US)]][[Category:Fariaz Karim of GILBERT AZ (US)]]

==METHODS AND TOOLS FOR PREVENTING THE COUNTERFEITING AND TAMPERING OF SEMICONDUCTOR DEVICES - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17883718 titled 'METHODS AND TOOLS FOR PREVENTING THE COUNTERFEITING AND TAMPERING OF SEMICONDUCTOR DEVICES

==Simplified Explanation==

The patent application is for an authentication system that uses inspection tools and processors to verify the authenticity and integrity of a device by comparing sets of hash values generated from images taken during inspections at different locations.

* First inspection tool generates images for initial inspection
* First processor processes images using hashing algorithm
* Second inspection tool generates images for secondary inspection
* Second processor processes images using hashing algorithm
* Second processor compares hash values to authenticate device

== Potential Applications ==
* Anti-counterfeiting measures for electronic devices
* Secure access control systems
* Supply chain management for verifying product authenticity

== Problems Solved ==
* Preventing tampering and counterfeiting of devices
* Ensuring the integrity of electronic products
* Enhancing security measures for authentication processes

== Benefits ==
* Increased security and trust in device authenticity
* Efficient and reliable authentication process
* Protection against counterfeit products and unauthorized modifications


==Original Abstract Submitted==

The present disclosure is directed to an authentication system, tools, and methods for authentication including a first inspection tool that generates first images for a first inspection of a device, and a first processor for processing the first images using a hashing algorithm, for which the first inspection tool and the first processor are sited at a first location, and a second inspection tool that generates second images for a second inspection of the device, and a second processor for processing the second images using the hashing algorithm, for which the second inspection tool and the second processor are sited at a second location. The second processor compares the first and second sets of hash values to authenticate the device as being authentic and untampered.



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