View source for 17854756. Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using simplified abstract (Microfabrica Inc.)

=Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using=


==Organization Name==

[[:Category:Microfabrica Inc.|Microfabrica Inc.]]


[[Category:Microfabrica Inc.]]

==Inventor(s)==

[[:Category:Ming Ting Wu of San Jose CA (US)|Ming Ting Wu of San Jose CA (US)]][[Category:Ming Ting Wu of San Jose CA (US)]]

[[:Category:Arun S. Veeramani of Vista CA (US)|Arun S. Veeramani of Vista CA (US)]][[Category:Arun S. Veeramani of Vista CA (US)]]

==Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17854756 titled 'Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using

==Simplified Explanation==

Embodiments are directed to probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat extension spring segment and wherein in some embodiments the probes also provide: (1) narrowed channel passage segments (e.g. by increasing width of plunger elements or by decreasing channel widths) along portions of channel lengths (e.g. not entire channel lengths) to enhance stability or pointing accuracy while still allowing for assembled formation of movable probe elements, and/or (2) ratcheting elements on probe arms and/or frame elements to allow permanent or semi-permanent transition from a build state or initial state to a working state or pre-biased state.

* Probes include at least one flat extension spring segment.
* Some probes have narrowed channel passage segments to enhance stability or pointing accuracy.
* Ratcheting elements on probe arms and/or frame elements allow for transition from a build state to a working state.

== Potential Applications ==
This technology could be applied in the fields of medical devices, electronics manufacturing, and nanotechnology research.

== Problems Solved ==
This technology solves the problem of stability and pointing accuracy in probe structures, allowing for more precise measurements and manipulations.

== Benefits ==
The benefits of this technology include improved accuracy, increased stability, and the ability to transition between different states easily.

== Potential Commercial Applications ==
Potential commercial applications of this technology include the development of high-precision measurement devices, advanced manufacturing tools, and cutting-edge research equipment.

== Possible Prior Art ==
One possible prior art could be the use of traditional probe structures without flat extension spring segments or ratcheting elements for stability and accuracy.

=== Unanswered Questions ===

=== How does this technology compare to existing probe structures in terms of cost-effectiveness? ===
This article does not provide information on the cost-effectiveness of this technology compared to existing probe structures. 

=== What are the potential limitations of using ratcheting elements in probe arms and frame elements? ===
This article does not address any potential limitations of using ratcheting elements in probe arms and frame elements.


==Original Abstract Submitted==

Embodiments are directed to probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat extension spring segment and wherein in some embodiments the probes also provide: (1) narrowed channel passage segments (e.g. by increasing width of plunger elements or by decreasing channel widths) along portions of channel lengths (e.g. not entire channel lengths) to enhance stability or pointing accuracy while still allowing for assembled formation of movable probe elements, and/or (2) ratcheting elements on probe arms and/or frame elements to allow permanent or semi-permanent transition from a build state or initial state to a working state or pre-biased state.



[[Category:G01R1/067]]