View source for 17842049. METHOD OF MANUFACTURING REFERENCE SAMPLE, METHOD OF MEASURING DROPLET, AND APPARATUS FOR MEASURING DROPLET simplified abstract (Samsung Display Co., Ltd.)

=METHOD OF MANUFACTURING REFERENCE SAMPLE, METHOD OF MEASURING DROPLET, AND APPARATUS FOR MEASURING DROPLET=


==Organization Name==

[[:Category:Samsung Display Co., Ltd.|Samsung Display Co., Ltd.]]


[[Category:Samsung Display Co., Ltd.]]

==Inventor(s)==

[[:Category:Young Soo Ko of Yongin-si (KR)|Young Soo Ko of Yongin-si (KR)]][[Category:Young Soo Ko of Yongin-si (KR)]]

[[:Category:Yeon Jae Lee of Yongin-si (KR)|Yeon Jae Lee of Yongin-si (KR)]][[Category:Yeon Jae Lee of Yongin-si (KR)]]

==METHOD OF MANUFACTURING REFERENCE SAMPLE, METHOD OF MEASURING DROPLET, AND APPARATUS FOR MEASURING DROPLET - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17842049 titled 'METHOD OF MANUFACTURING REFERENCE SAMPLE, METHOD OF MEASURING DROPLET, AND APPARATUS FOR MEASURING DROPLET

==Simplified Explanation==

The abstract describes a method of manufacturing a reference sample using droplets. Here is a simplified explanation of the abstract:

* The method involves discharging a droplet and capturing a series of images of the droplet as it falls.
* These images are analyzed to determine the path of the droplet.
* Based on the analysis, a point corresponding to the droplet's path is marked on a sample substrate.
* This method allows for the creation of a reference sample with precise markings.

==Potential Applications==
This technology could have various applications in industries such as:

* Manufacturing: The reference samples created using this method can be used for quality control and calibration purposes in manufacturing processes.
* Research and Development: The precise markings on the reference samples can aid in the development and testing of new materials and products.
* Forensics: This method could be used in forensic analysis to create reference samples for comparison and identification purposes.

==Problems Solved==
The method described in the patent application addresses the following problems:

* Precise marking: By analyzing the captured images, the method ensures accurate marking of a point corresponding to the droplet's falling path on the sample substrate.
* Efficiency: The predetermined period for capturing images allows for efficient analysis and marking of the droplet's path.
* Reproducibility: The method provides a consistent and reproducible way of manufacturing reference samples.

==Benefits==
The technology offers several benefits:

* Accuracy: The analysis of captured images ensures precise marking of the droplet's path, resulting in accurate reference samples.
* Efficiency: The method allows for quick and efficient manufacturing of reference samples.
* Reproducibility: The consistent process ensures that reference samples can be reproduced reliably.


==Original Abstract Submitted==

A method of manufacturing a reference sample includes discharging a droplet, obtaining a plurality of captured images by capturing the droplet according to a predetermined period with respect to an imaginary plane defined on a falling path of a discharged droplet, analyzing the plurality of captured images, and marking a point corresponding to the falling path of the droplet on a sample substrate based on a result of analyzing the plurality of captured images.



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