SEARCH RESULTS for assignor:"YANG, NIAN NILES"

Showing 1 to 14 of 14 results

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(X0) 15473044: THERMAL THROTTLING FOR MEMORY DEVICES

(A1) 20180284857: THERMAL THROTTLING FOR MEMORY DEVICES

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(X0) 14924615: MEMORY HEALTH MONITORING

(A1) 20160378400: MEMORY HEALTH MONITORING

(B2) 9: MEMORY HEALTH MONITORING

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(X0) 15167316: TEMPERATURE VARIATION COMPENSATION

(A1) 20170255403: TEMPERATURE VARIATION COMPENSATION

(B2) 9: TEMPERATURE VARIATION COMPENSATION

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(X0) 15876119: MEMORY DIE TEMPERATURE ADJUSTMENT BASED ON A POWER CONDITION

(A1) 20180143772: MEMORY DIE TEMPERATURE ADJUSTMENT BASED ON A POWER CONDITION

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(X0) 15347552: Storage System and Method for Temperature Throttling for Block Reading

(A1) 20180129431: Storage System and Method for Temperature Throttling for Block Reading

(B2) 9: Storage System and Method for Temperature Throttling for Block Reading

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(X0) 14700500: USE OF DUMMY WORD LINES FOR METADATA STORAGE

(A1) 20160322108: USE OF DUMMY WORD LINES FOR METADATA STORAGE

(B2) 9: USE OF DUMMY WORD LINES FOR METADATA STORAGE

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(X0) 14929179: Adaptive Multi-Phase Erase

(A1) 20170060445: Adaptive Multi-Phase Erase

(B2) 9: Adaptive Multi-Phase Erase

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(X0) 15262262: Block Health Monitoring Using Threshold Voltage Of Dummy Memory Cells

(A1) 20180075919: Block Health Monitoring Using Threshold Voltage Of Dummy Memory Cells

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(X0) 15264279: STORAGE SYSTEM AND METHOD FOR REDUCING XOR RECOVERY TIME BY EXCLUDING INVALID DATA FROM XOR PARITY

(A1) 20180074891: STORAGE SYSTEM AND METHOD FOR REDUCING XOR RECOVERY TIME BY EXCLUDING INVALID DATA FROM XOR PARITY

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(X0) 14918796: SYSTEM FOR HANDLING ERRATIC WORD LINES FOR NON-VOLATILE MEMORY

(A1) 20170116075: SYSTEM FOR HANDLING ERRATIC WORD LINES FOR NON-VOLATILE MEMORY

(B2) 9: SYSTEM FOR HANDLING ERRATIC WORD LINES FOR NON-VOLATILE MEMORY

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(X0) 15191150: NON-VOLATILE MEMORY WITH DYNAMIC REPURPOSE OF WORD LINE

(A1) 20170371755: NON-VOLATILE MEMORY WITH DYNAMIC REPURPOSE OF WORD LINE

(B2) 9: NON-VOLATILE MEMORY WITH DYNAMIC REPURPOSE OF WORD LINE

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(X0) 15240188: NON-VOLATILE MEMORY WITH READ DISTURB DETECTION FOR OPEN BLOCKS

(A1) 20180053562: NON-VOLATILE MEMORY WITH READ DISTURB DETECTION FOR OPEN BLOCKS

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(X0) 15782618: ERASURE CORRECTING CODING USING TEMPORARY ERASURE DATA

(A1) 20180032395: ERASURE CORRECTING CODING USING TEMPORARY ERASURE DATA

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(X0) 15225884: MEMORY DIE TEMPERATURE ADJUSTMENT BASED ON A POWER CONDITION

(A1) 20170090784: MEMORY DIE TEMPERATURE ADJUSTMENT BASED ON A POWER CONDITION

(B2) 9: MEMORY DIE TEMPERATURE ADJUSTMENT BASED ON A POWER CONDITION