SEARCH RESULTS for assignor:"WANG, CHUN-CHIEH"

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(X0) 15233964: AIR PRESSURE SENSING SYSTEM

(A1) 20170343441: AIR PRESSURE SENSING SYSTEM

(B2) 1: AIR PRESSURE SENSING SYSTEM

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(A1) 20180169786: METHOD FOR MANUFACTURING METAL STRIP

(X0) 15379671: METHOD FOR MANUFACTURING METAL STRIP

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(X0) 15356004: FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE

(A1) 20180145076: FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE

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(X0) 15725680: INSPECTION SYSTEM AND INSPECTION METHOD

(A1) 20180144460: INSPECTION SYSTEM AND INSPECTION METHOD

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(X0) 15857709: MEMS MICROPHONE PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE MEMS MICROPHONE PACKAGE STRUCTURES

(A1) 20180146302: MEMS MICROPHONE PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE MEMS MICROPHONE PACKAGE STRUCTURES

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(X0) 14979562: CELL AND METHOD AND SYSTEM FOR BANDWIDTH MANAGEMENT OF BACKHAUL NETWORK OF CELL

(A1) 20170064674: CELL AND METHOD AND SYSTEM FOR BANDWIDTH MANAGEMENT OF BACKHAUL NETWORK OF CELL

(B2) 9: CELL AND METHOD AND SYSTEM FOR BANDWIDTH MANAGEMENT OF BACKHAUL NETWORK OF CELL

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(X0) 15348652: FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE

(A1) 20180130802: FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE

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(X0) 15793769: PROJECTOR AND FOCAL LENGTH ADJUSTING METHOD

(A1) 20180120560: PROJECTOR AND FOCAL LENGTH ADJUSTING METHOD

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(X0) 15292428: STRUCTURE OF SEMICONDUCTOR DEVICE WITH SOURCE/DRAIN STRUCTURES

(A1) 20180108775: STRUCTURE OF SEMICONDUCTOR DEVICE WITH SOURCE/DRAIN STRUCTURES

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(X0) 15379983: SEMICONDUCTOR STRUCTURE WITH DOPANTS DIFFUSE PROTECTION AND METHOD FOR FORMING THE SAME

(B1) 9: SEMICONDUCTOR STRUCTURE WITH DOPANTS DIFFUSE PROTECTION AND METHOD FOR FORMING THE SAME