SEARCH RESULTS for assignor:"OWN, CHRISTOPHER SU-YAN"

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(X0) 13657843: ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY

(A1) 20130043387: ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY

(B2) 8: ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY

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(X0) 14071614: SCANNING TRANSMISSION ELECTRON MICROSCOPY FOR IMAGING EXTENDED AREAS

(A1) 20140054458: SCANNING TRANSMISSION ELECTRON MICROSCOPY FOR IMAGING EXTENDED AREAS

(B2) 8: SCANNING TRANSMISSION ELECTRON MICROSCOPY FOR IMAGING EXTENDED AREAS