SEARCH RESULTS for assignor:"AUGUSTYNIAK, EDWARD"

Showing 1 to 4 of 4 results

Last Update Patent(s) Assignor(s) Orig. Assignee(s) Assignee(s) Reel/Frame
21-Jun-2018

(A1) 20180175819: SYSTEMS AND METHODS FOR PROVIDING SHUNT CANCELLATION OF PARASITIC COMPONENTS IN A PLASMA REACTOR

(X0) 15382409: SYSTEMS AND METHODS FOR PROVIDING SHUNT CANCELLATION OF PARASITIC COMPONENTS IN A PLASMA REACTOR

RANGINENI, YASWANTH

KAPOOR, SUNIL

AUGUSTYNIAK, EDWARD

SAKIYAMA, YUKINORI

LAM RESEARCH CORPORATION

40670/357

12-Jun-2018

(X0) 15089960: SYSTEMS AND METHODS FOR FREQUENCY MODULATION OF RADIOFREQUENCY POWER SUPPLY FOR CONTROLLING PLASMA INSTABILITY

(A1) 20170141002: SYSTEMS AND METHODS FOR FREQUENCY MODULATION OF RADIOFREQUENCY POWER SUPPLY FOR CONTROLLING PLASMA INSTABILITY

(B2) 9: SYSTEMS AND METHODS FOR FREQUENCY MODULATION OF RADIOFREQUENCY POWER SUPPLY FOR CONTROLLING PLASMA INSTABILITY

KARIM, ISHTAK

SAKIYAMA, YUKINORI

RANGINENI, YASWANTH

AUGUSTYNIAK, EDWARD

KEIL, DOUGLAS

CHANDRASEKHARAN, RAMESH

LAVOIE, ADRIEN

LEESER, KARL

LAM RESEARCH CORPORATION

38185/4

24-Apr-2018

(X0) 15130176: MEASURING INDIVIDUAL LAYER THICKNESS DURING MULTI-LAYER DEPOSITION SEMICONDUCTOR PROCESSING

(A1) 20160307812: MEASURING INDIVIDUAL LAYER THICKNESS DURING MULTI-LAYER DEPOSITION SEMICONDUCTOR PROCESSING

(B2) 9: MEASURING INDIVIDUAL LAYER THICKNESS DURING MULTI-LAYER DEPOSITION SEMICONDUCTOR PROCESSING

KENANE, BOAZ

AUGUSTYNIAK, EDWARD

LAM RESEARCH CORPORATION

38307/889

25-Jan-2018

(X0) 15640053: CONTROL OF WAFER BOW IN MULTIPLE STATIONS

(A1) 20180025930: CONTROL OF WAFER BOW IN MULTIPLE STATIONS

AUGUSTYNIAK, EDWARD

FRENCH, DAVID

KAPOOR, SUNIL

SAKIYAMA, YUKINORI

THOMAS, GEORGE

LAM RESEARCH CORPORATION

42882/134