SEARCH RESULTS for assignee:"SK HYNIX INC."

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(X0) 15803374: MEMORY SYSTEM AND OPERATING METHOD THEREOF

(A1) 20180285256: MEMORY SYSTEM AND OPERATING METHOD THEREOF

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(X0) 15812638: SEMICONDUCTOR PACKAGES AND METHODS OF MANUFACTURING THE SAME

(A1) 20180286835: SEMICONDUCTOR PACKAGES AND METHODS OF MANUFACTURING THE SAME

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(X0) 15813502: MEMORY SYSTEM AND OPERATING METHOD THEREOF

(A1) 20180285197: MEMORY SYSTEM AND OPERATING METHOD THEREOF

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(X0) 15724084: NEUROMORPHIC DEVICE INCLUDING A SYNAPSE HAVING A VARIABLE RESISTOR AND A TRANSISTOR CONNECTED IN PARALLEL WITH EACH OTHER

(A1) 20180285721: NEUROMORPHIC DEVICE INCLUDING A SYNAPSE HAVING A VARIABLE RESISTOR AND A TRANSISTOR CONNECTED IN PARALLEL WITH EACH OTHER

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(X0) 15815845: SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

(A1) 20180286678: SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

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(X0) 15816313: WAFER LEVEL PACKAGES, SEMICONDUCTOR DEVICE UNITS, AND METHODS OF FABRICATING THE SAME

(A1) 20180286818: WAFER LEVEL PACKAGES, SEMICONDUCTOR DEVICE UNITS, AND METHODS OF FABRICATING THE SAME

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(X0) 15824968: SEMICONDUCTOR DEVICE HAVING MULTILAYER INTERCONNECTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME

(A1) 20180286806: SEMICONDUCTOR DEVICE HAVING MULTILAYER INTERCONNECTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME

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(X0) 15828701: MEMORY TEST SYSTEM AND AN OPERATING METHOD THEREOF

(A1) 20180285228: MEMORY TEST SYSTEM AND AN OPERATING METHOD THEREOF

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(X0) 15795497: DATA CONVERSION APPARATUS AND METHOD

(A1) 20180287628: DATA CONVERSION APPARATUS AND METHOD

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(X0) 15800411: CONTROLLER, MEMORY SYSTEM AND OPERATING METHOD THEREOF

(A1) 20180285213: CONTROLLER, MEMORY SYSTEM AND OPERATING METHOD THEREOF

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(X0) 15799649: SYNAPSE AND SYNAPSE ARRAY

(A1) 20180287056: SYNAPSE AND SYNAPSE ARRAY

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(X0) 15843465: SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF

(A1) 20180286493: SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF

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(X0) 15844060: SEMICONDUCTOR DEVICE, METHOD OF OPERATING A SEMICONDUCTOR DEVICE, AND SYSTEM INCLUDING THE SAME

(A1) 20180287613: SEMICONDUCTOR DEVICE, METHOD OF OPERATING A SEMICONDUCTOR DEVICE, AND SYSTEM INCLUDING THE SAME

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(X0) 15860851: NONVOLATILE MEMORY DEVICE

(A1) 20180286987: NONVOLATILE MEMORY DEVICE

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(X0) 15868583: FERROELECTRIC MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

(A1) 20180286988: FERROELECTRIC MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

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(X0) 15795475: IMAGE SENSOR HAVING OPTICAL FILTER AND OPERATING METHOD THEREOF

(A1) 20180288298: IMAGE SENSOR HAVING OPTICAL FILTER AND OPERATING METHOD THEREOF

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(X0) 15937994: METHOD FOR CONTROLLING PROGRAM VERIFY OPERATIONS OF A NON-VOLATILE MEMORY AND A CORRESPONDING CIRCUIT THEREOF

(A1) 20180286488: METHOD FOR CONTROLLING PROGRAM VERIFY OPERATIONS OF A NON-VOLATILE MEMORY AND A CORRESPONDING CIRCUIT THEREOF

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(X0) 15611301: MEMORY SYSTEM

(A1) 20170351449: MEMORY SYSTEM

(B2) 1: MEMORY SYSTEM

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(X0) 14966088: SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM

(A1) 20170067954: SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM

(B2) 1: SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM

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(X0) 15261143: MEMORY APPARATUS RELATING TO ON DIE TERMINATION

(A1) 20170351460: MEMORY APPARATUS RELATING TO ON DIE TERMINATION

(B2) 1: MEMORY APPARATUS RELATING TO ON DIE TERMINATION

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