SEARCH RESULTS for assignee:"MICRON TECHNOLOGY, INC."

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(X0) 15603327: SEMICONDUCTOR DEVICE ASSEMBLY WITH SURFACE-MOUNT DIE SUPPORT STRUCTURES

(A1) 20180342476: SEMICONDUCTOR DEVICE ASSEMBLY WITH SURFACE-MOUNT DIE SUPPORT STRUCTURES

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(X0) 15603295: METHOD AND APPARATUS FOR PRECHARGE AND REFRESH CONTROL

(A1) 20180342286: METHOD AND APPARATUS FOR PRECHARGE AND REFRESH CONTROL

(B2) 1: METHOD AND APPARATUS FOR PRECHARGE AND REFRESH CONTROL

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(X0) 15605853: MEMORY DEVICE WITH DYNAMIC PROGRAMMING CALIBRATION

(A1) 20180341552: MEMORY DEVICE WITH DYNAMIC PROGRAMMING CALIBRATION

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(X0) 15606415: METHODS OF FORMING SEMICONDUCTOR DEVICE STRUCTURES, AND RELATED SEMICONDUCTOR DEVICE STRUCTURES, SEMICONDUCTOR DEVICES, AND ELECTRONIC SYSTEMS

(A1) 20180342530: METHODS OF FORMING SEMICONDUCTOR DEVICE STRUCTURES, AND RELATED SEMICONDUCTOR DEVICE STRUCTURES, SEMICONDUCTOR DEVICES, AND ELECTRONIC SYSTEMS

(B2) 1: METHODS OF FORMING SEMICONDUCTOR DEVICE STRUCTURES, AND RELATED SEMICONDUCTOR DEVICE STRUCTURES, SEMICONDUCTOR DEVICES, AND ELECTRONIC SYSTEMS

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(X0) 16009091: MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION

(A1) 20180341416: MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION

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(A1) 20180342299: SEMICONDUCTOR MEMORY COLUMN DECODER DEVICE AND METHOD

(X0) 16036578: SEMICONDUCTOR MEMORY COLUMN DECODER DEVICE AND METHOD

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(X0) 15603063: APPARATUSES AND METHODS FOR DETECTION REFRESH STARVATION OF A MEMORY

(A1) 20180342282: APPARATUSES AND METHODS FOR DETECTION REFRESH STARVATION OF A MEMORY

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(X0) 15605855: MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION

(A1) 20180341415: MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION

(B2) 1: MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION

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(X0) 15605858: MEMORY DEVICE WITH DYNAMIC TARGET CALIBRATION

(A1) 20180341553: MEMORY DEVICE WITH DYNAMIC TARGET CALIBRATION

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(X0) 15606956: STACK ACCESS CONTROL FOR MEMORY DEVICE

(A1) 20180341575: STACK ACCESS CONTROL FOR MEMORY DEVICE

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(X0) 16035160: SOLID STATE LIGHTING DEVICE WITH DIFFERENT ILLUMINATION PARAMETERS AT DIFFERENT REGIONS OF AN EMITTER ARRAY

(A1) 20180342488: SOLID STATE LIGHTING DEVICE WITH DIFFERENT ILLUMINATION PARAMETERS AT DIFFERENT REGIONS OF AN EMITTER ARRAY

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(X0) 16036177: MEMORIES AND METHODS FOR PERFORMING VECTOR ATOMIC MEMORY OPERATIONS WITH MASK CONTROL AND VARIABLE DATA LENGTH AND DATA UNIT SIZE

(A1) 20180342270: MEMORIES AND METHODS FOR PERFORMING VECTOR ATOMIC MEMORY OPERATIONS WITH MASK CONTROL AND VARIABLE DATA LENGTH AND DATA UNIT SIZE

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(X0) 15603175: SEMICONDUCTOR DEVICE ASSEMBLY WITH DIE SUPPORT STRUCTURES

(A1) 20180342475: SEMICONDUCTOR DEVICE ASSEMBLY WITH DIE SUPPORT STRUCTURES

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(X0) 15606185: ERROR DETECTION CODE HOLD PATTERN SYNCHRONIZATION

(A1) 20180342265: ERROR DETECTION CODE HOLD PATTERN SYNCHRONIZATION

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(X0) 15606194: SYSTEMS AND METHODS FOR MULTI-STAGE DATA SERIALIZATION IN A MEMORY SYSTEM

(A1) 20180343015: SYSTEMS AND METHODS FOR MULTI-STAGE DATA SERIALIZATION IN A MEMORY SYSTEM

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(X0) 16054189: PROGRAMMING INTERRUPTION MANAGEMENT

(A1) 20180341605: PROGRAMMING INTERRUPTION MANAGEMENT

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(X0) 16054206: NONCONSECUTIVE SENSING OF MULTILEVEL MEMORY CELLS

(A1) 20180342303: NONCONSECUTIVE SENSING OF MULTILEVEL MEMORY CELLS

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(X0) 16054702: VIRTUAL REGISTER FILE

(A1) 20180341597: VIRTUAL REGISTER FILE

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(X0) 16055247: DISTRIBUTED INPUT/OUTPUT VIRTUALIZATION

(A1) 20180341536: DISTRIBUTED INPUT/OUTPUT VIRTUALIZATION

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(X0) 16057170: RESISTIVE MEMORY SENSING

(A1) 20180342294: RESISTIVE MEMORY SENSING