SEARCH RESULTS for assignee:"APPLIED MATERIALS, INC."
Showing 1 to 20 of 514 results
| Last Update | Patent(s) | Assignor(s) | Orig. Assignee(s) | Assignee(s) | Reel/Frame |
|---|---|---|---|---|---|
| 14-Jun-2018 |
(X0) 1: SUBSTRATE CARRIER SYSTEM WITH PROTECTIVE COVERING (A1) 2: SUBSTRATE CARRIER SYSTEM WITH PROTECTIVE COVERING |
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| 14-Jun-2018 |
(X0) 1: NEW REPAIR METHOD FOR ELECTROSTATIC CHUCK (A1) 2: NEW REPAIR METHOD FOR ELECTROSTATIC CHUCK |
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| 14-Jun-2018 |
(X0) 1: METHODS FOR DEPOSITING POLYMER LAYER FOR SENSOR APPLICATIONS VIA HOT WIRE CHEMICAL VAPOR DEPOSITION (A1) 2: METHODS FOR DEPOSITING POLYMER LAYER FOR SENSOR APPLICATIONS VIA HOT WIRE CHEMICAL VAPOR DEPOSITION |
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| 14-Jun-2018 |
(X0) 1: METHOD OF FORMING CONFORMAL EPITAXIAL SEMICONDUCTOR CLADDING MATERIAL OVER A FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE (A1) 2: METHOD OF FORMING CONFORMAL EPITAXIAL SEMICONDUCTOR CLADDING MATERIAL OVER A FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE |
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| 14-Jun-2018 |
(X0) 1: METHODS FOR SILICIDE FORMATION (A1) 2: METHODS FOR SILICIDE FORMATION |
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| 14-Jun-2018 |
(X0) 1: UNIFORM CRACK-FREE ALUMINUM DEPOSITION BY TWO STEP ALUMINUM ELECTROPLATING PROCESS (A1) 2: UNIFORM CRACK-FREE ALUMINUM DEPOSITION BY TWO STEP ALUMINUM ELECTROPLATING PROCESS |
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| 14-Jun-2018 |
(X0) 1: COLLIMATED OLED LIGHT FIELD DISPLAY (A1) 2: COLLIMATED OLED LIGHT FIELD DISPLAY |
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| 14-Jun-2018 |
(X0) 1: VIRTUAL SENSOR FOR CHAMBER CLEANING ENDPOINT (A1) 2: VIRTUAL SENSOR FOR CHAMBER CLEANING ENDPOINT |
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| 14-Jun-2018 |
(X0) 1: PRECURSOR CONTROL SYSTEM AND PROCESS (A1) 2: PRECURSOR CONTROL SYSTEM AND PROCESS |
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| 14-Jun-2018 |
(X0) 1: SUBSTRATE FEATURES FOR INDUCTIVE MONITORING OF CONDUCTIVE TRENCH DEPTH (A1) 2: SUBSTRATE FEATURES FOR INDUCTIVE MONITORING OF CONDUCTIVE TRENCH DEPTH |
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| 14-Jun-2018 |
(X0) 1: QUARTZ CRYSTAL MICROBALANCE UTILIZATION FOR FORELINE SOLIDS FORMATION QUANTIFICATION (A1) 2: QUARTZ CRYSTAL MICROBALANCE UTILIZATION FOR FORELINE SOLIDS FORMATION QUANTIFICATION |
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| 14-Jun-2018 |
(X0) 1: CMP PAD CONSTRUCTION WITH COMPOSITE MATERIAL PROPERTIES USING ADDITIVE MANUFACTURING PROCESSES (A1) 2: CMP PAD CONSTRUCTION WITH COMPOSITE MATERIAL PROPERTIES USING ADDITIVE MANUFACTURING PROCESSES |
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| 14-Jun-2018 |
(X0) 1: CREATING ION ENERGY DISTRIBUTION FUNCTIONS (IEDF) (A1) 2: CREATING ION ENERGY DISTRIBUTION FUNCTIONS (IEDF) |
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| 13-Jun-2018 |
(X0) 1: HEATER PEDESTAL ASSEMBLY FOR WIDE RANGE TEMPERATURE CONTROL (A1) 2: HEATER PEDESTAL ASSEMBLY FOR WIDE RANGE TEMPERATURE CONTROL |
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| 12-Jun-2018 |
(X0) 1: PRINTED CHEMICAL MECHANICAL POLISHING PAD HAVING PRINTED WINDOW (A1) 2: PRINTED CHEMICAL MECHANICAL POLISHING PAD HAVING PRINTED WINDOW (B2) 9: PRINTED CHEMICAL MECHANICAL POLISHING PAD HAVING PRINTED WINDOW |
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| 12-Jun-2018 |
(X0) 1: METHOD AND APPARATUS FOR BACKSIDE CLEANING OF SUBSTRATES (A1) 2: METHOD AND APPARATUS FOR BACKSIDE CLEANING OF SUBSTRATES (B2) 9: METHOD AND APPARATUS FOR BACKSIDE CLEANING OF SUBSTRATES |
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| 12-Jun-2018 |
(X0) 1: METHOD AND APPARATUS FOR BACKSIDE CLEANING OF SUBSTRATES (A1) 2: METHOD AND APPARATUS FOR BACKSIDE CLEANING OF SUBSTRATES (B2) 9: METHOD AND APPARATUS FOR BACKSIDE CLEANING OF SUBSTRATES |
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| 12-Jun-2018 |
(X0) 1: RESIST SENSITIVITY AND PROFILE IMPROVEMENT VIA ACID ANION CONTROL DURING FIELD-GUIDED POST EXPOSURE BAKE (A1) 2: RESIST SENSITIVITY AND PROFILE IMPROVEMENT VIA ACID ANION CONTROL DURING FIELD-GUIDED POST EXPOSURE BAKE |
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| 11-Jun-2018 |
(X0) 1: HOLDING ASSEMBLY FOR SUBSTRATE PROCESSING CHAMBER (A1) 2: HOLDING ASSEMBLY FOR SUBSTRATE PROCESSING CHAMBER |
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| 08-Jun-2018 |