SEARCH RESULTS for APPLIED MATERIALS, INC.

Recent Patent Assignments Patent Assignments - (Total found: 440)

Last Update Patent(s) Assignor(s) Orig. Assignee(s) Assignee(s) Reel/Frame
15-Feb-2018

(X0) 15796495: RARE-EARTH OXIDE BASED CHAMBER MATERIAL

(A1) 20180044247: RARE-EARTH OXIDE BASED CHAMBER MATERIAL

SUN, JENNIFER Y.

KANUNGO, BIRAJA P.

APPLIED MATERIALS, INC.

43974/926

15-Feb-2018

(X0) 15665545: MODEL BASED LAMP BACKGROUND FILTRATION OF STRAY RADIATION FOR PYROMETRY

(A1) 20180045575: MODEL BASED LAMP BACKGROUND FILTRATION OF STRAY RADIATION FOR PYROMETRY

PATALAY, KAILASH KIRAN

HUNTER, AARON MUIR

APPLIED MATERIALS, INC.

43152/201

15-Feb-2018

(X0) 15349433: PULSE SHAPE CONTROLLER FOR SPUTTER SOURCES

(A1) 20180044781: PULSE SHAPE CONTROLLER FOR SPUTTER SOURCES

STOWELL, MICHAEL W.

BABAYAN, VIACHSLAV

LIU, JINGJING

HUA, ZHONG QIANG

APPLIED MATERIALS, INC.

40291/711

15-Feb-2018

(X0) 15456009: BOTTOM PROCESSING

(A1) 20170263466: BOTTOM PROCESSING

RANISH, JOSEPH M.

HUNTER, AARON MUIR

SRINIVASAN, SWAMINATHAN T.

APPLIED MATERIALS, INC.

44932/760

15-Feb-2018

(X0) 15724049: SUPPORT RING WITH ENCAPSULATED LIGHT BARRIER

(A1) 20180047597: SUPPORT RING WITH ENCAPSULATED LIGHT BARRIER

RANISH, JOSEPH M.

APPLIED MATERIALS, INC.

43771/258

15-Feb-2018

(X0) 15675682: INDUCTIVELY COUPLED PLASMA CHAMBER HAVING A MULTI-ZONE SHOWERHEAD

(A1) 20180047542: INDUCTIVELY COUPLED PLASMA CHAMBER HAVING A MULTI-ZONE SHOWERHEAD

NGUYEN, ANDREW

CHANG, XUE

APPLIED MATERIALS, INC.

43870/164

15-Feb-2018

(X0) 15675101: CRITICAL METHODOLOGY IN VACUUM CHAMBERS TO DETERMINE GAP AND LEVELING BETWEEN WAFER AND HARDWARE COMPONENTS

(A1) 20180046088: CRITICAL METHODOLOGY IN VACUUM CHAMBERS TO DETERMINE GAP AND LEVELING BETWEEN WAFER AND HARDWARE COMPONENTS

OGISO, HIROYUKI

ZHOU, JIANHUA

SU, ZONGHUI

ROCHA-ALVAREZ, JUAN CARLOS

LEE, JEONGMIN

NARASIMHA, KARTHIK THIMMAVAJJULA

GILBERT, RICK

PARK, SANG HEON

KHAJA, ABDUL AZIZ

PRABHAKAR, VINAY

APPLIED MATERIALS, INC.

43359/645

15-Feb-2018

(X0) 15726233: DUAL ENDPOINT DETECTION FOR ADVANCED PHASE SHIFT AND BINARY PHOTOMASKS

(A1) 20180047574: DUAL ENDPOINT DETECTION FOR ADVANCED PHASE SHIFT AND BINARY PHOTOMASKS

GRIMBERGEN, MICHAEL N.

APPLIED MATERIALS, INC.

43840/967

15-Feb-2018

(X0) 15722810: POLISHING ARTICLES AND INTEGRATED SYSTEM AND METHODS FOR MANUFACTURING CHEMICAL MECHANICAL POLISHING ARTICLES

(A1) 20180043613: POLISHING ARTICLES AND INTEGRATED SYSTEM AND METHODS FOR MANUFACTURING CHEMICAL MECHANICAL POLISHING ARTICLES

KRISHNAN, KASIRAMAN

REDFIELD, DANIEL

PERRY, RUSSELL EDWARD

MENK, GREGORY E.

BAJAJ, RAJEEV

REDEKER, FRED C.

PATIBANDLA, NAG B.

ORILALL, MAHENDRA C. C.

FUNG, JASON G. G.

APPLIED MATERIALS, INC.

43759/70

15-Feb-2018

(X0) 15796487: RARE-EARTH OXIDE BASED CHAMBER MATERIAL

(A1) 20180044246: RARE-EARTH OXIDE BASED CHAMBER MATERIAL

SUN, JENNIFER Y.

KANUNGO, BIRAJA P.

APPLIED MATERIALS, INC.

43974/951

15-Feb-2018

(X0) 15493690: 3D CTF INTEGRATION USING HYBRID CHARGE TRAP LAYER OF SIN AND SELF ALIGNED SIGE NANODOT

(A1) 20180047743: 3D CTF INTEGRATION USING HYBRID CHARGE TRAP LAYER OF SIN AND SELF ALIGNED SIGE NANODOT

KWON, THOMAS JONGWAN

APPLIED MATERIALS, INC.

43073/500

15-Feb-2018

(X0) 15793935: FIELD GUIDED POST EXPOSURE BAKE APPLICATION FOR PHOTORESIST MICROBRIDGE DEFECTS

(A1) 20180046085: FIELD GUIDED POST EXPOSURE BAKE APPLICATION FOR PHOTORESIST MICROBRIDGE DEFECTS

GODET, LUDOVIC

NAM, SANG KI

OUYANG, CHRISTINE

APPLIED MATERIALS, INC.

43951/825

15-Feb-2018

(X0) 15795070: METHOD OF SELECTIVE EPITAXY

(A1) 20180047569: METHOD OF SELECTIVE EPITAXY

HUANG, YI-CHIAU

CHUNG, HUA

DUBE, ABHISHEK

APPLIED MATERIALS, INC.

44273/202

15-Feb-2018

(X0) 15674180: PROCESS KIT EROSION AND SERVICE LIFE PREDICTION

(A1) 20180047599: PROCESS KIT EROSION AND SERVICE LIFE PREDICTION

CHIANG, KANG-LIE

BLACKBURN, GREG A.

ZHANG, PALLAVI

ARMACOST, MICHAEL D.

KHURANA, NITIN

APPLIED MATERIALS, INC.

43286/496

15-Feb-2018

(X0) 15672886: Thermal Profile Monitoring Wafer And Methods Of Monitoring Temperature

(A1) 20180047643: Thermal Profile Monitoring Wafer And Methods Of Monitoring Temperature

JADHAV, DEEPAK

APPLIED MATERIALS, INC.

44154/238

15-Feb-2018

SUN, JENNIFER Y.

KANUNGO, BIRAJA P.

APPLIED MATERIALS, INC.

44664/724

15-Feb-2018

(X0) 15673015: METHOD AND APPARATUS FOR CONTROLLING GAS FLOW TO A PROCESS CHAMBER

(A1) 20180046206: METHOD AND APPARATUS FOR CONTROLLING GAS FLOW TO A PROCESS CHAMBER

NGUYEN, ANDREW

CHANG, XUE

APPLIED MATERIALS, INC.

43870/112

15-Feb-2018

(X0) 15233613: THERMALLY OPTIMIZED RINGS

(A1) 20180044783: THERMALLY OPTIMIZED RINGS

SHEELAVANT, GANGADHAR

BADUVAMANDA, CARIAPPA ACHAPPA

VASANTHA, BOPANNA ICHETTIRA

APPLIED MATERIALS, INC.

39566/556

13-Feb-2018

(X0) 13250906: PRE-HEAT RING DESIGNS TO INCREASE DEPOSITION UNIFORMITY AND SUBSTRATE THROUGHPUT

(A1) 20120103263: PRE-HEAT RING DESIGNS TO INCREASE DEPOSITION UNIFORMITY AND SUBSTRATE THROUGHPUT

(B2) 9890455: PRE-HEAT RING DESIGNS TO INCREASE DEPOSITION UNIFORMITY AND SUBSTRATE THROUGHPUT

MYO, NYI O.

WEBB, JOHN S.

ISHII, MASATO

LI, XUEBIN

YE, ZHIYUAN

ZOJAJI, ALI

N/A

APPLIED MATERIALS, INC.

27180/703

13-Feb-2018

(X0) 14993596: SENSOR SYSTEM FOR SEMICONDUCTOR MANUFACTURING APPARATUS

(A1) 20160126121: SENSOR SYSTEM FOR SEMICONDUCTOR MANUFACTURING APPARATUS

(B2) 9892947: SENSOR SYSTEM FOR SEMICONDUCTOR MANUFACTURING APPARATUS

SCHAUER, RONALD VERN

DASCOLI, RAPHAEL

BHARGAVA, SHIVAN

N/A

APPLIED MATERIALS, INC.

37830/356

13-Feb-2018

(X0) 15587129: PARTICLE GENERATION SUPPRESOR BY DC BIAS MODULATION

(A1) 20170236689: PARTICLE GENERATION SUPPRESOR BY DC BIAS MODULATION

(B2) 9892888: PARTICLE GENERATION SUPPRESOR BY DC BIAS MODULATION

BAEK, JONGHOON

PARK, SOONAM

CHEN, XINGLONG

LUBOMIRSKY, DMITRY

N/A

APPLIED MATERIALS, INC.

43227/49

13-Feb-2018

(X0) 12485160: Multi-Zone Resistive Heater

(A1) 20090314762: Multi-Zone Resistive Heater

(B2) 9892941: Multi-Zone Resistive Heater

CUI, ANQING

TRAN, BINH

TAM, ALEXANDER

SMITH, JACOB W.

IYER, R. SURYANARAYANAN

YUDOVSKY, JOSEPH

SEUTTER, SEAN M.

N/A

APPLIED MATERIALS, INC.

23198/301

13-Feb-2018

(X0) 14735189: BATCH EPITAXY PROCESSING SYSTEM HAVING GAS DEFLECTORS

(A1) 20160002821: BATCH EPITAXY PROCESSING SYSTEM HAVING GAS DEFLECTORS

(B2) 9890473: BATCH EPITAXY PROCESSING SYSTEM HAVING GAS DEFLECTORS

NEWMAN, JACOB

N/A

APPLIED MATERIALS, INC.

35997/270

13-Feb-2018

(X0) 15211934: RARE-EARTH OXIDE BASED MONOLITHIC CHAMBER MATERIAL

(A1) 20160326061: RARE-EARTH OXIDE BASED MONOLITHIC CHAMBER MATERIAL

(B2) 9890086: RARE-EARTH OXIDE BASED MONOLITHIC CHAMBER MATERIAL

SUN, JENNIFER Y.

KANUNGO, BIRAJA P.

N/A

APPLIED MATERIALS, INC.

39170/387

09-Feb-2018

(X0) 15668965: PYROMETER BACKGROUND ELIMINATION

(A1) 20170328775: PYROMETER BACKGROUND ELIMINATION

ADERHOLD, WOLFGANG R.

APPLIED MATERIALS, INC.

44862/380

08-Feb-2018

(X0) 15671862: SURFACE TREATMENT FOR IMPROVEMENT OF PARTICLE PERFORMANCE

(A1) 20180040457: SURFACE TREATMENT FOR IMPROVEMENT OF PARTICLE PERFORMANCE

WU, BANQIU

APPLIED MATERIALS, INC.

43580/689

08-Feb-2018

(X0) 15674108: LOW-TEMPERATURE ATOMIC LAYER DEPOSITION OF BORON NITRIDE AND BN STRUCTURES

(A1) 20180040476: LOW-TEMPERATURE ATOMIC LAYER DEPOSITION OF BORON NITRIDE AND BN STRUCTURES

NEMANI, SRINIVAS D.

YIEH, ELLIE Y.

APPLIED MATERIALS, INC.

43980/199

08-Feb-2018

(X0) 15784972: GAS COOLED SUBSTRATE SUPPORT FOR STABILIZED HIGH TEMPERATURE DEPOSITION

(A1) 20180037987: GAS COOLED SUBSTRATE SUPPORT FOR STABILIZED HIGH TEMPERATURE DEPOSITION

WEST, BRIAN

COX, MICHAEL S.

OH, JEONGHOON

APPLIED MATERIALS, INC.

44025/298

08-Feb-2018

(X0) 15784834: PHOTO-ASSISTED DEPOSITION OF FLOWABLE FILMS

(A1) 20180040473: PHOTO-ASSISTED DEPOSITION OF FLOWABLE FILMS

UNDERWOOD, BRIAN SAXTON

MALLICK, ABHIJIT BASU

SRINIVASAN, MUKUND

ROCHA-ALVAREZ, JUAN CARLOS

APPLIED MATERIALS, INC.

44327/57

08-Feb-2018

(X0) 15667281: PRECISION SCREEN PRINTING WITH SUB-MICRON UNIFORMITY OF METALLIZATION MATERIALS ON GREEN SHEET CERAMIC

(A1) 20180040498: PRECISION SCREEN PRINTING WITH SUB-MICRON UNIFORMITY OF METALLIZATION MATERIALS ON GREEN SHEET CERAMIC

HUANG, SHIH-YING

BABAYAN, STEVEN E.

CRIMINALE, PHILLIP

PROUTY, STEPHEN

HUANG, ANTHONY

APPLIED MATERIALS, INC.

43418/556

08-Feb-2018

(X0) 15338989: THIN FILM BATTERY DEVICE AND METHOD OF FORMATION

(A1) 20180040860: THIN FILM BATTERY DEVICE AND METHOD OF FORMATION

YOUNG, MICHAEL YU-TAK

FRANKLIN, JEFFREY L.

APPLIED MATERIALS, INC.

40398/828

07-Feb-2018

(X0) 15659417: SINGLE USE RINSE IN A LINEAR MARANGONI DRIER

(A1) 20170323810: SINGLE USE RINSE IN A LINEAR MARANGONI DRIER

BROWN, BRIAN J.

APPLIED MATERIALS, INC.

44847/215

06-Feb-2018

(X0) 14256781: PROTECTIVE COVER FOR ELECTROSTATIC CHUCK

(A1) 20140318575: PROTECTIVE COVER FOR ELECTROSTATIC CHUCK

(B2) 9887121: PROTECTIVE COVER FOR ELECTROSTATIC CHUCK

PARKHE, VIJAY D.

N/A

APPLIED MATERIALS, INC.

33376/323

06-Feb-2018

(X0) 14470236: SUBSTRATE PLACEMENT DETECTION IN SEMICONDUCTOR EQUIPMENT USING THERMAL RESPONSE CHARACTERISTICS

(A1) 20150063405: SUBSTRATE PLACEMENT DETECTION IN SEMICONDUCTOR EQUIPMENT USING THERMAL RESPONSE CHARACTERISTICS

(B2) 9885567: SUBSTRATE PLACEMENT DETECTION IN SEMICONDUCTOR EQUIPMENT USING THERMAL RESPONSE CHARACTERISTICS

LEE, JARED AHMAD

SALINAS, MARTIN JEFFREY

ZHOU, YI

LEE, CHANGHUN

N/A

APPLIED MATERIALS, INC.

34479/739

06-Feb-2018

(X0) 14626147: ENDPOINT METHOD USING PEAK LOCATION OF SPECTRA CONTOUR PLOTS VERSUS TIME

(A1) 20150160649: ENDPOINT METHOD USING PEAK LOCATION OF SPECTRA CONTOUR PLOTS VERSUS TIME

(B2) 9886026: ENDPOINT METHOD USING PEAK LOCATION OF SPECTRA CONTOUR PLOTS VERSUS TIME

DAVID, JEFFREY DRUE

LEE, HARRY Q.

BENVEGNU, DOMINIC J.

SWEDEK, BOGUSLAW A.

N/A

APPLIED MATERIALS, INC.

35095/283

06-Feb-2018

(X0) 14634711: SUBSTRATE SUPPORT WITH MULTIPLE HEATING ZONES

(A1) 20160192444: SUBSTRATE SUPPORT WITH MULTIPLE HEATING ZONES

(B2) 9888528: SUBSTRATE SUPPORT WITH MULTIPLE HEATING ZONES

MATSUSHITA, TOMOHARU

RAVI, JALLEPALLY

TSAI, CHENG-HSIUNG

KAMATH, ARAVIND

YUAN, XIAOXIONG

KOPPA, MANJUNATHA

N/A

APPLIED MATERIALS, INC.

35616/629

06-Feb-2018

(X0) 14673228: METHODS AND APPARATUSES FOR UTILIZING ADAPTIVE PREDICTIVE ALGORITHMS AND DETERMINING WHEN TO USE THE ADAPTIVE PREDICTIVE ALGORITHMS FOR VIRTUAL METROLOGY

(A1) 20150205270: METHODS AND APPARATUSES FOR UTILIZING ADAPTIVE PREDICTIVE ALGORITHMS AND DETERMINING WHEN TO USE THE ADAPTIVE PREDICTIVE ALGORITHMS FOR VIRTUAL METROLOGY

(B2) 9886009: METHODS AND APPARATUSES FOR UTILIZING ADAPTIVE PREDICTIVE ALGORITHMS AND DETERMINING WHEN TO USE THE ADAPTIVE PREDICTIVE ALGORITHMS FOR VIRTUAL METROLOGY

MOYNE, JAMES

N/A

APPLIED MATERIALS, INC.

36101/770

06-Feb-2018

(X0) 14619474: CONDITIONED SEMICONDUCTOR SYSTEM PARTS

(A1) 20150275361: CONDITIONED SEMICONDUCTOR SYSTEM PARTS

(B2) 9885117: CONDITIONED SEMICONDUCTOR SYSTEM PARTS

LUBOMIRSKY, DMITRY

KIM, SUNG JE

N/A

APPLIED MATERIALS, INC.

36429/605

06-Feb-2018

(X0) 15001156: PLASMA TREATMENT ON METAL-OXIDE TFT

(A1) 20160218000: PLASMA TREATMENT ON METAL-OXIDE TFT

(B2) 9887277: PLASMA TREATMENT ON METAL-OXIDE TFT

CHOI, SOO YOUNG

PARK, BEOM SOO

CUI, YI

WON, TAE KYUNG

YIM, DONG-KIL

N/A

APPLIED MATERIALS, INC.

37756/917

06-Feb-2018

(X0) 15211933: RARE-EARTH OXIDE BASED MONOLITHIC CHAMBER MATERIAL

(A1) 20160326060: RARE-EARTH OXIDE BASED MONOLITHIC CHAMBER MATERIAL

(B2) 9884787: RARE-EARTH OXIDE BASED MONOLITHIC CHAMBER MATERIAL

SUN, JENNIFER Y.

KANUNGO, BIRAJA J.

N/A

APPLIED MATERIALS, INC.

39170/515

06-Feb-2018

(X0) 14246915: PROCESSING SYSTEMS AND METHODS FOR HALIDE SCAVENGING

(A1) 20140262038: PROCESSING SYSTEMS AND METHODS FOR HALIDE SCAVENGING

WANG, ANCHUAN

CHEN, XINGLONG

LI, ZIHUI

HAMANA, HIROSHI

CHEN, ZHIJUN

HSU, CHING-MEI

HUANG, JIAYIN

INGLE, NITIN K.

LUBOMIRSKY, DMITRY

VENKATARAMAN, SHANKAR

THAKUR, RANDHIR

APPLIED MATERIALS, INC.

44833/339

01-Feb-2018

(X0) 15717844: ION ASSISTED DEPOSITION TOP COAT OF RARE-EARTH OXIDE

(A1) 20180030589: ION ASSISTED DEPOSITION TOP COAT OF RARE-EARTH OXIDE

SUN, JENNIFER Y.

KANUNGO, BIRAJA P.

FIROUZDOR, VAHID

APPLIED MATERIALS, INC.

43723/281

01-Feb-2018

(X0) 15417473: PERFORMING DECOUPLED PLASMA FLUORINATION TO REDUCE INTERFACIAL DEFECTS IN FILM STACK

(A1) 20180033619: PERFORMING DECOUPLED PLASMA FLUORINATION TO REDUCE INTERFACIAL DEFECTS IN FILM STACK

LIU, WEI

WANG, LINLIN

APPLIED MATERIALS, INC.

41412/906

01-Feb-2018

(X0) 15727105: WAFER EDGE MEASUREMENT AND CONTROL

(A1) 20180033667: WAFER EDGE MEASUREMENT AND CONTROL

KOELMEL, BLAKE

APPLIED MATERIALS, INC.

43806/897

01-Feb-2018

(X0) 15727351: CVD SILICON MONOLAYER FORMATION METHOD AND GATE OXIDE ALD FORMATION ON SEMICONDUCTOR MATERIALS

(A1) 20180033610: CVD SILICON MONOLAYER FORMATION METHOD AND GATE OXIDE ALD FORMATION ON SEMICONDUCTOR MATERIALS

CHANG, MEI

KACHIAN, JESSICA S.

APPLIED MATERIALS, INC.

43808/550

01-Feb-2018

(X0) 15414500: SILICON GERMANIUM SELECTIVE OXIDATION PROCESS

(A1) 20180033615: SILICON GERMANIUM SELECTIVE OXIDATION PROCESS

TJANDRA, AGUS SOFIAN

APPLIED MATERIALS, INC.

42259/464

01-Feb-2018

(X0) 15652499: Extreme Ultraviolet Mask Blank With Multilayer Absorber And Method Of Manufacture

(A1) 20180031964: Extreme Ultraviolet Mask Blank With Multilayer Absorber And Method Of Manufacture

JINDAL, VIBHU

APPLIED MATERIALS, INC.

43973/64

01-Feb-2018

(X0) 15617613: METHOD OF UNIFORM CHANNEL FORMATION

(A1) 20180033873: METHOD OF UNIFORM CHANNEL FORMATION

YAN, CHUN

BAO, XINYU

APPLIED MATERIALS, INC.

42800/713

01-Feb-2018

(X0) 15655229: CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM WITH A DEFORMABLE MIRROR IN ADDITIVE MANUFACTURING

(A1) 20180029126: CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM WITH A DEFORMABLE MIRROR IN ADDITIVE MANUFACTURING

NG, HOU T.

NAFTALI, RON

TALBOT, CHRISTOPHER G.

APPLIED MATERIALS, INC.

44437/940

01-Feb-2018

(X0) 15417556: METHOD OF FORMING STRUCTURES WITH V SHAPED BOTTOM ON SILICON SUBSTRATE

(A1) 20180033621: METHOD OF FORMING STRUCTURES WITH V SHAPED BOTTOM ON SILICON SUBSTRATE

BAO, XINYU

YAN, CHUN

SANCHEZ, ERROL ANTONIO C.

APPLIED MATERIALS, INC.

43271/419