SEARCH RESULTS for assignor:SIN, CHUN CHOL

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(X0) 16210859: METHODS AND APPARATUS FOR PROFILE AND SURFACE PREPARATION OF RETAINING RINGS UTILIZED IN CHEMICAL MECHANICAL POLISHING PROCESSES

(A1) 20190105754: METHODS AND APPARATUS FOR PROFILE AND SURFACE PREPARATION OF RETAINING RINGS UTILIZED IN CHEMICAL MECHANICAL POLISHING PROCESSES

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(X0) 14879526: METHODS AND APPARATUS FOR PROFILE AND SURFACE PREPARATION OF RETAINING RINGS UTILIZED IN CHEMICAL MECHANICAL POLISHING PROCESSES

(A1) 20160121453: METHODS AND APPARATUS FOR PROFILE AND SURFACE PREPARATION OF RETAINING RINGS UTILIZED IN CHEMICAL MECHANICAL POLISHING PROCESSES

(B2) 1: METHODS AND APPARATUS FOR PROFILE AND SURFACE PREPARATION OF RETAINING RINGS UTILIZED IN CHEMICAL MECHANICAL POLISHING PROCESSES

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(X0) 15388423: CURVED DISPLAY DEVICE

(A1) 20180031906: CURVED DISPLAY DEVICE

(B2) 1: CURVED DISPLAY DEVICE

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(X0) 15615202: BLOWER APPARATUS

(A1) 20170356465: BLOWER APPARATUS

(B2) 1: BLOWER APPARATUS

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(X0) 15572291: FRICTION MATERIAL, IN PARTICULAR FOR THE MANUFACTURING OF A BRAKE PAD, AND ASSOCIATED PREPARATION METHOD

(A1) 20180128335: FRICTION MATERIAL, IN PARTICULAR FOR THE MANUFACTURING OF A BRAKE PAD, AND ASSOCIATED PREPARATION METHOD

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(X0) 15977628: LIGHT-MODULATED QUANTUM DOT COLOR DISPLAY AND METHOD FOR MANUFACTURING THE SAME

(A1) 20190079354: LIGHT-MODULATED QUANTUM DOT COLOR DISPLAY AND METHOD FOR MANUFACTURING THE SAME

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(X0) 15586212: OPTICAL IMAGING LENS

(A1) 20180275372: OPTICAL IMAGING LENS

(B2) 1: OPTICAL IMAGING LENS

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(X0) 15758666: METHOD OF INHIBITING QUORUM SENSING IN PSEUDOMONAS AERUGINOSA

(A1) 20180243331: METHOD OF INHIBITING QUORUM SENSING IN PSEUDOMONAS AERUGINOSA

(B2) 1: METHOD OF INHIBITING QUORUM SENSING IN PSEUDOMONAS AERUGINOSA

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(X0) 15286626: APPARATUS AND METHOD FOR EXCHANGING PROBE

(A1) 20170160341: APPARATUS AND METHOD FOR EXCHANGING PROBE

(B2) 1: APPARATUS AND METHOD FOR EXCHANGING PROBE

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(X0) 13894430: TOUCH PANEL AND TOUCH SENSING DISPLAY USING THE SAME

(A1) 20190064954: TOUCH PANEL AND TOUCH SENSING DISPLAY USING THE SAME

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(X0) 15688824: SEMICONDUCTOR STRUCTURE WITH DOPED FIN-SHAPED STRUCTURES AND METHOD OF FABRICATING THE SAME

(A1) 20190067477: SEMICONDUCTOR STRUCTURE WITH DOPED FIN-SHAPED STRUCTURES AND METHOD OF FABRICATING THE SAME

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(X0) 15835817: PRINTED CIRCUIT BOARD AND METHOD FOR MANUFACTURING THE SAME

(A1) 20190069417: PRINTED CIRCUIT BOARD AND METHOD FOR MANUFACTURING THE SAME

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(X0) 15879455: APPARATUS AND METHOD FOR MEASURING PERFORMANCE OF MEMORY ARRAY

(A1) 20190066815: APPARATUS AND METHOD FOR MEASURING PERFORMANCE OF MEMORY ARRAY

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(X0) 16000828: Media Intelligence Automation System

(A1) 20190065911: Media Intelligence Automation System

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(X0) 15065901: GRAIN ANALYZING METHOD AND SYSTEM USING HRTEM IMAGE

(A1) 20160267643: GRAIN ANALYZING METHOD AND SYSTEM USING HRTEM IMAGE

(B2) 1: GRAIN ANALYZING METHOD AND SYSTEM USING HRTEM IMAGE

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(X0) 16167844: VIA SUPPORT STRUCTURE UNDER PAD AREAS FOR BSI BONDABILITY IMPROVEMENT

(A1) 20190057998: VIA SUPPORT STRUCTURE UNDER PAD AREAS FOR BSI BONDABILITY IMPROVEMENT

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(X0) 15045689: ELECTRONIC DEVICE

(A1) 20160253015: ELECTRONIC DEVICE

(B2) 1: ELECTRONIC DEVICE

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(X0) 15306569: MEMS DEVICES ON FLEXIBLE SUBSTRATE

(A1) 20170073215: MEMS DEVICES ON FLEXIBLE SUBSTRATE

(B2) 1: MEMS DEVICES ON FLEXIBLE SUBSTRATE

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(X0) 15702523: CONTROL SYSTEM AND METHOD FOR IMPROVING THERMAL STABILITY

(A1) 20190047104: CONTROL SYSTEM AND METHOD FOR IMPROVING THERMAL STABILITY

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(X0) 15960701: WAFER MAP ANALYZER, METHOD FOR ANALYZING WAFER MAP USING THE SAME AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

(A1) 20190050979: WAFER MAP ANALYZER, METHOD FOR ANALYZING WAFER MAP USING THE SAME AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE