SEARCH RESULTS for assignor:KUSKO, MARY P

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(X0) 15681626: CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

(A1) 20190056449: CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

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(X0) 15439161: STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATED CIRCUITS

(A1) 20180238962: STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATED CIRCUITS

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(X0) 15439176: NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS

(A1) 20180238964: NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS

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(X0) 15405481: SCAN CHAIN LATENCY REDUCTION

(A1) 20180203064: SCAN CHAIN LATENCY REDUCTION

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(A1) 20180203066: SCAN CHAIN LATENCY REDUCTION

(X0) 15807834: SCAN CHAIN LATENCY REDUCTION

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(X0) 15404355: OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY

(A1) 20180196497: OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY

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(X0) 15813280: DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTERN GENERATION

(A1) 20180075170: DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTERN GENERATION

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(X0) 15238477: ADJUSTING LATENCY IN A SCAN CELL

(A1) 20180052198: ADJUSTING LATENCY IN A SCAN CELL

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(X0) 15238528: ADJUSTING LATENCY IN A SCAN CELL

(A1) 20180052199: ADJUSTING LATENCY IN A SCAN CELL