SEARCH RESULTS for assignor:KUSKO, MARY P

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(X0) 15970375: ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

(A1) 20180252769: ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

(B2) 1: ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

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(X0) 15681626: CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

(A1) 20190056449: CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

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(X0) 15806388: CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

(A1) 20190056450: CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

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(X0) 15405481: SCAN CHAIN LATENCY REDUCTION

(A1) 20180203064: SCAN CHAIN LATENCY REDUCTION

(B2) 1: SCAN CHAIN LATENCY REDUCTION

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(X0) 15813280: DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTERN GENERATION

(A1) 20180075170: DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTERN GENERATION

(B2) 1: DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTERN GENERATION